Lin You

Lin You

Micron Technology Inc - - / United States
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 4523501
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person_outline Lin You's MOST POPULAR ARTICLES
1-) Influence of Metal–MoS2 Interface on MoS2 Transistor Performance: Comparison of Ag and Ti ContactsH Yuan, G Cheng, L You, H Li, H Zhu, W Li, JJ Kopanski, YS Obeng, ...ACS applied materials & interfaces 7 (2), 1180-1187, 20151012015
2-) Microwave-based metrology platform development: application of broad-band RF metrology to integrated circuit reliability analysesL You, CA Okoro, JJ Ahn, JJ Kopanski, YS ObengECS Transactions 61 (6), 113, 201457*2014
3-) Subsurface imaging of metal lines embedded in a dielectric with a scanning microwave microscopeL You, JJ Ahn, YS Obeng, JJ KopanskiJournal of Physics D: Applied Physics 49 (4), 045502, 2015232015
4-) Electronic properties and structure of single crystal peryleneSJ Pookpanratana, KP Goetz, EG Bittle, H Haneef, L You, CA Hacker, ...Organic electronics 61, 157-163, 2018202018
5-) Scanning probe microscopes for subsurface imagingJJ Kopanski, L You, JJ Ahn, E Hitz, YS ObengECS Transactions 61 (2), 185, 201418*2014