Luca Maresca

Luca Maresca

Università degli Studi di Napoli Federico II - Napoli / Italy
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 1796906
University of Naples Federico II
person_outline Luca Maresca's MOST POPULAR ARTICLES
1-) A comprehensive study of short-circuit ruggedness of silicon carbide power MOSFETsG Romano, A Fayyaz, M Riccio, L Maresca, G Breglio, A Castellazzi, ...IEEE Journal of Emerging and Selected Topics in Power Electronics 4 (3), 978-987, 20161932016
2-) Short-circuit failure mechanism of SiC power MOSFETsG Romano, L Maresca, M Riccio, V d\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\'Alessandro, G Breglio, A Irace, ...2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\'s …, 2015822015
3-) A temperature-dependent SPICE model of SiC power MOSFETs for within and out-of-SOA simulationsM Riccio, V d\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\'Alessandro, G Romano, L Maresca, G Breglio, A IraceIEEE Transactions on power electronics 33 (9), 8020-8029, 2017482017
4-) Statistical analysis of the electrothermal imbalances of mismatched parallel SiC power MOSFETsA Borghese, M Riccio, A Fayyaz, A Castellazzi, L Maresca, G Breglio, ...IEEE Journal of Emerging and Selected Topics in Power Electronics 7 (3 …, 2019512019
5-) Influence of the SiC/SiO2 SiC MOSFET Interface Traps Distribution on C–V Measurements Evaluated by TCAD SimulationsL Maresca, I Matacena, M Riccio, A Irace, G Breglio, S DalientoIEEE Journal of Emerging and Selected Topics in Power Electronics 9 (2 …, 2019332019