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Mann Ho Cho
Yonsei University - Seoul / South Korea
Natural Sciences / Physics
AD Scientific Index ID: 414724
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Mann Ho Cho's MOST POPULAR ARTICLES
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Thermal stability and structural characteristics of films on Si (100) grown by atomic-layer depositionMH Cho, YS Roh, CN Whang, K Jeong, SW Nahm, DH Ko, JH Lee, NI Lee, ...Applied physics letters 81 (3), 472-474, 20024122002
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The breakthrough in data retention time of DRAM using Recess-Channel-Array Transistor (RCAT) for 88 nm feature size and beyondJY Kim, CS Lee, SE Kim, IB Chung, YM Choi, BJ Park, JW Lee, DI Kim, ...2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No …, 20032702003
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Improved Growth Behavior of Atomic-Layer-Deposited High-k Dielectrics on Multilayer MoS2 by Oxygen Plasma PretreatmentJ Yang, S Kim, W Choi, SH Park, Y Jung, MH Cho, H KimACS applied materials & interfaces 5 (11), 4739-4744, 20131922013
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High concentration of nitrogen doped into graphene using N 2 plasma with an aluminum oxide buffer layerSH Park, J Chae, MH Cho, JH Kim, KH Yoo, SW Cho, TG Kim, JW KimJournal of Materials Chemistry C 2 (5), 933-939, 2014179*2014
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Interfacial characteristics of HfO2 grown on nitrided Ge (100) substrates by atomic-layer depositionH Kim, PC McIntyre, CO Chui, KC Saraswat, MH ChoApplied physics letters 85 (14), 2902-2904, 20041762004
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