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Michael Kolbe
Physikalisch-Technische Bundesanstalt - Braunschweig / Germany
Natural Sciences / Physics
AD Scientific Index ID: 4434470
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Michael Kolbe's MOST POPULAR ARTICLES
1-)
Reference-free total reflection X-ray fluorescence analysis of semiconductor surfaces with synchrotron radiation Analytical chemistry 79 (20), 7873-7882, 2007
2-)
Thickness determination for Cu and Ni nanolayers: Comparison of completely reference-free fundamental parameter-based X-ray fluorescence analysis and X-ray reflectometry Spectrochimica Acta Part B: Atomic Spectroscopy 60 (4), 505-510, 2005
3-)
Experimental search for the low-energy nuclear transition in 229Th with undulator radiation New Journal of Physics 17 (5), 053053, 2015
4-)
Depth profile characterization of ultra shallow junction implants Analytical and bioanalytical chemistry 396, 2825-2832, 2010
5-)
Depth profile characterization of ultra shallow junction implantsP Hönicke, B Beckhoff, M Kolbe, D Giubertoni, J van den Berg, G PepponiAnalytical and bioanalytical chemistry 396, 2825-2832, 2010762010
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