Michael Nelhiebel

Michael Nelhiebel

Infineon Technologies - - / Germany
Engineering & Technology / Metallurgical & Materials Engineering
AD Scientific Index ID: 4433315
person_outline Michael Nelhiebel's MOST POPULAR ARTICLES
1-) The paradigm shift in understanding the bias temperature instability: From reaction–diffusion to switching oxide trapsT Grasser, B Kaczer, W Goes, H Reisinger, T Aichinger, P Hehenberger, ...IEEE Transactions on Electron Devices 58 (11), 3652-3666, 20115132011
2-) A two-stage model for negative bias temperature instabilityT Grasser, B Kaczer, W Goes, T Aichinger, P Hehenberger, M Nelhiebel2009 IEEE international reliability physics symposium, 33-44, 20092892009
3-) Analytic modeling of the bias temperature instability using capture/emission time mapsT Grasser, PJ Wagner, H Reisinger, T Aichinger, G Pobegen, M Nelhiebel, ...2011 International Electron Devices Meeting, 27.4. 1-27.4. 4, 20112172011
4-) Switching oxide traps as the missing link between negative bias temperature instability and random telegraph noiseT Grasser, H Reisinger, W Goes, T Aichinger, P Hehenberger, PJ Wagner, ...2009 IEEE International Electron Devices Meeting (IEDM), 1-4, 20091522009
5-) Theory of orientation-sensitive near-edge fine-structure core-level spectroscopyM Nelhiebel, PH Louf, P Schattschneider, P Blaha, K Schwarz, B JouffreyPhysical Review B 59 (20), 12807, 19991491999