Mohamed Youssef Messous

Mohamed Youssef Messous

Centre National de l'Energie, des Sciences et des Techniques Nucleaires - Rabat / Morocco
Engineering & Technology / Metallurgical & Materials Engineering
AD Scientific Index ID: 4410683
المركز الوطني للطاقة والعلوم والتكنولوجيا النووية
person_outline Mohamed Youssef Messous's MOST POPULAR ARTICLES
1-) Validation of a NaI (Tl) and LaBr3 (Ce) detector\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\'s models via measurements and Monte Carlo simulationsI Mouhti, A Elanique, MY Messous, B Belhorma, A BenahmedJournal of radiation research and applied sciences 11 (4), 335-339, 2018322018
2-) Monte Carlo modelling of a NaI (Tl) scintillator detectors using MCNP simulation codeI Mouhti, A Elanique, MY MessousJ. Mater. Environ. Sci 8 (12), 4560-4565, 2017262017
3-) Characterization of CsI (Tl) and LYSO (Ce) scintillator detectors by measurements and Monte Carlo simulationsI Mouhti, A Elanique, MY Messous, A Benahmed, JE McFee, Y Elgoub, ...Applied Radiation and Isotopes 154, 108878, 2019102019
4-) Comparative investigation of structural, EPR, optical and photoluminescence properties of nanostructured LaPO4: Ce/RE/Me and LaPO4: Yb/Er phosphors prepared by co-precipitation …O AitMellal, L Oufni, MY Messous, MM Trandafir, IM Chirica, M Florea, ...Journal of Solid State Chemistry 301, 122310, 2021152021
5-) Structural properties and near-infrared light from Ce3+/Nd3+-co-doped LaPO4 nanophosphors for solar cell applicationsO AitMellal, L Oufni, MY Messous, M Tahri, Ş Neatu, M Florea, F Neatu, ...Journal of Materials Science: Materials in Electronics 33 (7), 4197-4210, 2022142022