Niemat Moultif

Niemat Moultif

Université de Rouen Normandie - Mont-Saint-Aignan / France
Natural Sciences / Physics
AD Scientific Index ID: 5043993
University of Rouen Normandie
person_outline Niemat Moultif's MOST POPULAR ARTICLES
1-) Reliability assessment of AlGaN/GaN HEMTs on the SiC substrate under the RF stress IEEE Transactions on Power Electronics 36 (7), 7442-7450, 2020
2-) S-band pulsed-RF operating life test on AlGaN/GaN HEMT devices for radar application Microelectronics Reliability 100, 113434, 2019
3-) Characterization of HTRB stress effects on SiC MOSFETs using photon emission spectral signatures Microelectronics Reliability 76, 243-248, 2017
4-) Thermal analysis of AlGaN/GaN high-electron mobility transistors using I–V pulsed characterizations and infra red microscopy IEEE Transactions on Device and Materials Reliability 19 (4), 704-710, 2019
5-) Dopant activity for highly in-situ doped polycrystalline silicon: hall, XRD, scanning capacitance microscopy (SCM) and scanning spreading resistance microscopy (SSRM) Nano Express 2 (1), 010037, 2021