Nilanjan Mukherjee

Nilanjan Mukherjee

Mentor Graphics Corporation - / United States
Others
AD Scientific Index ID: 5285443
person_outline Nilanjan Mukherjee's MOST POPULAR ARTICLES
1-) Embedded deterministic testJ Rajski, J Tyszer, M Kassab, N MukherjeeIEEE transactions on computer-aided design of integrated circuits and …, 20046412004
2-) Embedded deterministic test for low cost manufacturing test J Rajski, J Tyszer, M Kassab, N Mukherjee, R Thompson, KH Tsai, ... Proceedings. International Test Conference, 301-310, 2002 4822002
3-) Optimal core wrapper width selection and SOC test scheduling based on 3-D bin packing algorithm Y Huang, SM Reddy, WT Cheng, P Reuter, N Mukherjee, CC Tsai, ... Proceedings. International Test Conference, 74-82, 2002 2132002
4-) Test pattern compression for an integrated circuit test environmentJ Rajski, J Tyszer, M Kassab, N MukherjeeUS Patent 6,327,687, 2001208*2001
5-) Method and apparatus for selectively compacting test responsesJ Rajski, J Tyszer, M Kassab, N MukherjeeUS Patent 6,557,129, 2003190*2003