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Paul Ho
University of Texas Austin - Austin / United States
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AD Scientific Index ID: 1640778
University of Texas at Austin
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Paul Ho's MOST POPULAR ARTICLES
1-)
Electromigration in metalsPS Ho, T KwokReports on Progress in Physics 52 (3), 301, 19899551989
2-)
Low dielectric constant materials for ULSI interconnectsM Morgen, ET Ryan, JH Zhao, C Hu, T Cho, PS HoAnnual Review of Materials Science 30 (1), 645-680, 20004912000
3-)
Plasma processing of low-k dielectricsMR Baklanov, JF de Marneffe, D Shamiryan, AM Urbanowicz, H Shi, ...Journal of Applied Physics 113 (4), 20133502013
4-)
Electromigration reliability issues in dual-damascene Cu interconnectionsET Ogawa, KD Lee, VA Blaschke, PS HoIEEE Transactions on reliability 51 (4), 403-419, 20023552002
5-)
Low-dielectric-constant materials for ULSI interlayer-dielectric applicationsWW Lee, PS HoMRS bulletin 22 (10), 19-27, 19973431997
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