NEWS
New Feature: Compare Your Institution with the Previous Year
Find a Professional: Explore Experts Across 197 Disciplines in 220 Countries!
Find a Professional
Print Your Certificate
New! Young University / Institution Rankings 2025
New! Art & Humanities Rankings 2025
New! Social Sciences and Humanities Rankings 2025
Highly Cited Researchers 2025
AD
Scientific Index 2025
Scientist Rankings
University Rankings
Subject Rankings
Country Rankings
login
Login
person_add
Register
insights
H-Index Rankings
insights
i10 Productivity Rankings
format_list_numbered
Citation Rankings
subject
University Subject Rankings
school
Young Universities
format_list_numbered
Top 100 Scientists
format_quote
Top 100 Institutions
format_quote
Compare & Choose
local_fire_department
Country Reports
person
Find a Professional
Paul Solomon
IBM Corporation - New York / United States
Natural Sciences / Physics
AD Scientific Index ID: 4464857
Registration, Add Profile,
Premium Membership
Print Your Certificate
Ranking &
Analysis
Job
Experiences (0)
Education
Information (0)
Published Books (0)
Book Chapters (0)
Articles (0)
Presentations (0)
Lessons (0)
Projects (0)
Congresses (0)
Editorship, Referee &
Scientific Board (0 )
Patents /
Designs (0)
Academic Grants
& Awards (0)
Artistic
Activities (0)
Certificate / Course
/ Trainings (0)
Association &
Society Memberships (0)
Contact, Office
& Social Media
person_outline
Paul Solomon's MOST POPULAR ARTICLES
1-)
Device scaling limits of Si MOSFETs and their application dependenciesDJ Frank, RH Dennard, E Nowak, PM Solomon, Y Taur, HSP WongProceedings of the IEEE 89 (3), 259-288, 200118692001
2-)
An integrated logic circuit assembled on a single carbon nanotubeZ Chen, J Appenzeller, YM Lin, J Sippel-Oakley, AG Rinzler, J Tang, ...Science 311 (5768), 1735-1735, 20067242006
3-)
Nanoscale cmosHSP Wong, DJ Frank, PM Solomon, CHJ Wann, JJ WelserProceedings of the IEEE 87 (4), 537-570, 19996881999
4-)
Six-band calculation of the hole mobility in silicon inversion layers: Dependence on surface orientation, strain, and silicon thicknessMV Fischetti, Z Ren, PM Solomon, M Yang, K RimJournal of Applied Physics 94 (2), 1079-1095, 20036262003
5-)
Silicon CMOS devices beyond scalingW Haensch, EJ Nowak, RH Dennard, PM Solomon, A Bryant, ...IBM Journal of Research and Development 50 (4.5), 339-361, 20066232006
ARTICLES
Add your articles
We use cookies to personalize our website and offer you a better experience. If you accept cookies, we can offer you special services.
Cookie Policy
Accept