Peyman Pouyan

Peyman Pouyan

NXP Semiconductors - Eindhoven / Netherlands
Others
AD Scientific Index ID: 4541682
person_outline Peyman Pouyan's MOST POPULAR ARTICLES
1-) Reliability challenges in design of memristive memoriesP Pouyan, E Amat, A Rubio2014 5th European Workshop on CMOS Variability (VARI), 1-6, 2014602014
2-) Memristive Crossbar Memory Lifetime Evaluation and Reconfiguration StrategiesP Pouyan, E Amat, A RubioIEEE Transactions on Emerging Topics in Computing, 2016342016
3-) A VLSI implementation of logarithmic and exponential functions using a novel parabolic synthesis methodology compared to the CORDIC algorithmP Pouyan, E Hertz, P Nilsson2011 20th European Conference on Circuit Theory and Design (ECCTD), 709-712, 2011302011
4-) Test and reliability of emerging non-volatile memoriesS Hamdioui, P Pouyan, H Li, Y Wang, A Raychowdhur, I Yoon2017 IEEE 26th Asian Test Symposium (ATS), 175-183, 2017272017
5-) RRAM variability and its mitigation schemesP Pouyan, E Amat, S Hamdioui, A Rubio2016 26th international workshop on power and timing modeling, optimization …, 2016242016