Peyush Pande

Peyush Pande

Graphic Era University - Dehradun / India
Others
AD Scientific Index ID: 5432188
ग्राफ़िक एरा विश्वविद्यालय
person_outline Peyush Pande's MOST POPULAR ARTICLES
1-) Comparison of commercial planar and trench SiC MOSFETs by electrical characterization of performance-degrading near-interface trapsM Chaturvedi, S Dimitrijev, D Haasmann, HA Moghadam, P Pande, ...IEEE Transactions on Electron Devices 69 (11), 6225-6230, 2022
2-) Quantified density of performance-degrading near-interface traps in SiC MOSFETsM Chaturvedi, S Dimitrijev, D Haasmann, HA Moghadam, P Pande, ...Scientific reports 12 (1), 4076, 2022
3-) Electrical characterization of SiC MOS capacitors: A critical reviewP Pande, D Haasmann, J Han, HA Moghadam, P Tanner, S DimitrijevMicroelectronics Reliability 112, 113790, 2020
4-) Direct measurement of active near-interface traps in the strong-accumulation region of 4H-SiC MOS capacitorsP Pande, S Dimitrijev, D Haasmann, HA Moghadam, P Tanner, J HanIEEE Journal of the Electron Devices Society 6, 468-474, 2018
5-) Modeling power GaN-HEMTs using standard MOSFET equations and parameters in SPICEU Jadli, F Mohd-Yasin, HA Moghadam, P Pande, M Chaturvedi, ...Electronics 10 (2), 130, 2021