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Pratik Maheshwari
Missouri University of Science & Technology - Rolla / United States
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AD Scientific Index ID: 4848507
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Pratik Maheshwari's MOST POPULAR ARTICLES
1-)
The development of an EM-field probing system for manual near-field scanning IEEE transactions on Electromagnetic Compatibility 58 (2), 356-363, 2016
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Application of emission source microscopy technique to EMI source localization above 5 GHz 2014 IEEE International Symposium on Electromagnetic Compatibility (EMC), 7-11, 2014
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Real time bridge scour monitoring with magneto-inductive field coupling Sensors and Smart Structures Technologies for Civil, Mechanical, and …, 2013
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The impact of near-field scanning size on the accuracy of far-field estimation 2014 IEEE International Symposium on Electromagnetic Compatibility (EMC …, 2014
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A systematic method for determining soft-failure robustness of a subsystem 2013 35th Electrical Overstress/Electrostatic Discharge Symposium, 1-8, 2013
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