NEWS
New Feature: Compare Your Institution with the Previous Year
Find a Professional: Explore Experts Across 197 Disciplines in 220 Countries!
Find a Professional
Print Your Certificate
New! Young University / Institution Rankings 2025
New! Art & Humanities Rankings 2025
New! Social Sciences and Humanities Rankings 2025
Highly Cited Researchers 2025
AD
Scientific Index 2025
Scientist Rankings
University Rankings
Subject Rankings
Country Rankings
login
Login
person_add
Register
insights
H-Index Rankings
insights
i10 Productivity Rankings
format_list_numbered
Citation Rankings
subject
University Subject Rankings
school
Young Universities
format_list_numbered
Top 100 Scientists
format_quote
Top 100 Institutions
format_quote
Compare & Choose
local_fire_department
Country Reports
person
Find a Professional
Purushothaman Srinivasan
GlobalFoundries - New York / United States
Others
AD Scientific Index ID: 5050645
Registration, Add Profile,
Premium Membership
Print Your Certificate
Ranking &
Analysis
Job
Experiences (0)
Education
Information (0)
Published Books (0)
Book Chapters (0)
Articles (0)
Presentations (0)
Lessons (0)
Projects (0)
Congresses (0)
Editorship, Referee &
Scientific Board (0 )
Patents /
Designs (0)
Academic Grants
& Awards (0)
Artistic
Activities (0)
Certificate / Course
/ Trainings (0)
Association &
Society Memberships (0)
Contact, Office
& Social Media
person_outline
Purushothaman Srinivasan's MOST POPULAR ARTICLES
1-)
Noise in Drain and Gate Current of MOSFETs With High- Gate StacksP Magnone, F Crupi, G Giusi, C Pace, E Simoen, C Claeys, L Pantisano, ...IEEE Transactions on Device and Materials Reliability 9 (2), 180-189, 20091432009
2-)
Graphene: Is it the future for semiconductors? An overview of the material, devices, and applicationsY Obeng, P SrinivasanThe Electrochemical Society Interface 20 (1), 47, 2011692011
3-)
Impact of the interfacial layer on the low-frequency noise (1/f) behavior of MOSFETs with advanced gate stacksF Crupi, P Srinivasan, P Magnone, E Simoen, C Pace, D Misra, C ClaeysIEEE Electron Device Letters 27 (8), 688-691, 2006692006
4-)
A 7nm CMOS technology platform for mobile and high performance compute applicationS Narasimha, B Jagannathan, A Ogino, D Jaeger, B Greene, C Sheraw, ...2017 IEEE International Electron Devices Meeting (IEDM), 29.5. 1-29.5. 4, 2017682017
5-)
Reliability comparison of triple-gate versus planar SOI FETsF Crupi, B Kaczer, R Degraeve, V Subramanian, P Srinivasan, E Simoen, ...IEEE Transactions on electron devices 53 (9), 2351-2357, 2006532006
ARTICLES
Add your articles
We use cookies to personalize our website and offer you a better experience. If you accept cookies, we can offer you special services.
Cookie Policy
Accept