R Opila

R Opila

University of Delaware - Newark / United States
Engineering & Technology / Metallurgical & Materials Engineering
AD Scientific Index ID: 1777649
person_outline R Opila's MOST POPULAR ARTICLES
1-) Promising Thermoelectric Properties of Commercial PEDOT:PSS Materials and Their Bi2Te3 Powder Composites ACS applied materials & interfaces 2 (11), 3170-3178, 2010
2-) Profiling nitrogen in ultrathin silicon oxynitrides with angle-resolved x-ray photoelectron spectroscopy Journal of Applied Physics 87 (9), 4449-4455, 2000
3-) Properties of high κ gate dielectrics and for SiJ Kwo, M Hong, AR Kortan, KL Queeney, YJ Chabal, RL Opila Jr, ...Journal of Applied Physics 89 (7), 3920-3927, 20013902001
4-) Infrared spectroscopic analysis of the interface structure of thermally oxidized siliconKT Queeney, MK Weldon, JP Chang, YJ Chabal, AB Gurevich, J Sapjeta, ...Journal of Applied Physics 87 (3), 1322-1330, 20003462000
5-) Profiling nitrogen in ultrathin silicon oxynitrides with angle-resolved x-ray photoelectron spectroscopyJP Chang, ML Green, VM Donnelly, RL Opila, J Eng Jr, J Sapjeta, ...Journal of Applied Physics 87 (9), 4449-4455, 20003292000