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Ramin Rajaei
University of Notre Dame - Notre Dame / United States
Engineering & Technology / Computer Science
AD Scientific Index ID: 1503972
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Ramin Rajaei's MOST POPULAR ARTICLES
1-)
Design of Robust SRAM Cells Against Single-Event Multiple Effects for Nanometer TechnologiesR Rajaei, B Asgari, M Tabandeh, M FazeliIEEE Transactions on Device and Materials Reliability 15 (3), 429 - 436, 2015792015
2-)
Low cost soft error hardened latch designs for nano-scale CMOS technology in presence of process variationR Rajaei, M Tabandeh, M FazeliMicroelectronics Reliability 53 (6), 912-924, 2013672013
3-)
Radiation Hardened Design of Nonvolatile MRAM-based FPGAR RajaeiIEEE Transactions on Magnetics (TMAG), 2016602016
4-)
Fully Nonvolatile and Low Power Full-Adder based on Spin Transfer Torque Magnetic Tunnel Junction with Spin-Hall Effect AssistanceA Amirany, R RajaeiIEEE Transactions on Magnetics, 2018582018
5-)
Single event multiple upset (SEMU) tolerant latch designs in presence of process and temperature variationsR Rajaei, M Tabandeh, M FazeliJournal of Circuits, Systems and Computers 24 (01), 1550007, 2015582015
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