Ran Wang

nVidia Corporation - Santa Clara / United States

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AD Scientific Index ID: 4892444

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Ran Wang's MOST POPULAR ARTICLES

1-) Scan-based testing of post-bond silicon interposer interconnects in 2.5-D ICs R Wang, K Chakrabarty, B Eklow IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2014 282014

2-) A programmable method for low-power scan shift in SoC integrated circuits R Wang, B Bhaskaran, K Natarajan, A Abdollahian, K Narayanun, ... 2016 IEEE 34th VLSI Test Symposium (VTS), 1-6, 2016 232016

3-) Test and design-for-testability solutions for 3D integrated circuitsK Chakrabarty, M Agrawal, S Deutsch, B Noia, R Wang, F YeIPSJ Transactions on System and LSI Design Methodology 7, 56-73, 2014242014

4-) Built-in self-test and test scheduling for interposer-based 2.5 D ICR Wang, K Chakrabarty, S BhawmikACM Transactions on Design Automation of Electronic Systems (TODAES) 20 (4 …, 2015232015

5-) Interconnect testing and test-path scheduling for interposer-based 2.5-D ICsR Wang, K Chakrabarty, S BhawmikIEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2014232014

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