Rdce

Rdce

ON Semiconductor - Montreal / United States
Others
AD Scientific Index ID: 4969994
person_outline Rdce's MOST POPULAR ARTICLES
1-) Optical properties and phase change transition in flash evaporated thin films studied by temperature dependent spectroscopic ellipsometry J Orava, T Wágner, J Šik, J Přikryl, M Frumar, L Beneš Journal of Applied Physics 104 (4), 043523, 2008 1012008
2-) The physical mechanism of dispersion caused by AlGaN/GaN buffers on Si and optimization for low dispersion S Stoffels, M Zhao, R Venegas, P Kandaswamy, S You, T Novak, ... 2015 IEEE International Electron Devices Meeting (IEDM), 35.4. 1-35.4. 4, 2015 382015
3-) Long-wavelength interface modes in semiconductor layer structures M Schubert, T Hofmann, J Šik Physical Review B 71 (3), 035324, 2005 382005
4-) Optical properties of As33S67− xSex bulk glasses studied by spectroscopic ellipsometryJ Orava, J Šik, T Wagner, M FrumarJournal of Applied Physics 103 (8), 2008352008
5-) Defect engineering during Czochralski crystal growth and silicon wafer manufacturingL Válek, J ŚikModern Aspects of Bulk and Thin Film Preparation. InTech: Rijeka, 43-70, 2012212012