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Roger Alvis
ASML Holding - Veldhoven / Netherlands
Engineering & Technology / Metallurgical & Materials Engineering
AD Scientific Index ID: 4965966
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Roger Alvis's MOST POPULAR ARTICLES
1-)
Review of atom probe FIB-based specimen preparation methods MK Miller, KF Russell, K Thompson, R Alvis, DJ Larson Microscopy and microanalysis 13 (6), 428-436, 2007 4192007
2-)
Atom probe tomography of electronic materials TF Kelly, DJ Larson, K Thompson, RL Alvis, JH Bunton, JD Olson, ... Annu. Rev. Mater. Res. 37, 681-727, 2007 2512007
3-)
Atom probe tomography todayA Cerezo, PH Clifton, MJ Galtrey, CJ Humphreys, TF Kelly, DJ Larson, ...Materials Today 10 (12), 36-42, 20071482007
4-)
Atomic layer deposition of ruthenium thin films from an amidinate precursorH Wang, RG Gordon, R Alvis, RM UlfigChemical Vapor Deposition 15 (10‐12), 312-319, 2009802009
5-)
Deposition of a conductor in a via hole or trenchPR Besser, JA Iacoponi, R AlvisUS Patent 5,918,149, 1999781999
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