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Ron Schrimpf
Vanderbilt University - Nashville / United States
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 1325921
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Ron Schrimpf's MOST POPULAR ARTICLES
1-)
Charge collection and charge sharing in a 130 nm CMOS technologyOA Amusan, AF Witulski, LW Massengill, BL Bhuva, PR Fleming, ML Alles, ...IEEE Transactions on nuclear science 53 (6), 3253-3258, 20064332006
2-)
Response of advanced bipolar processes to ionizing radiationEW Enlow, RL Pease, W Combs, RD Schrimpf, RN NowlinIEEE transactions on nuclear science 38 (6), 1342-1351, 19913941991
3-)
Physical mechanisms contributing to enhanced bipolar gain degradation at low dose ratesDM Fleetwood, SL Kosier, RN Nowlin, RD Schrimpf, RA Reber, M DeLaus, ...IEEE Transactions on Nuclear Science 41 (6), 1871-1883, 19943611994
4-)
Physical model for enhanced interface-trap formation at low dose ratesSN Rashkeev, CR Cirba, DM Fleetwood, RD Schrimpf, SC Witczak, ...IEEE Transactions on Nuclear Science 49 (6), 2650-2655, 20022972002
5-)
Monte Carlo simulation of single event effectsRA Weller, MH Mendenhall, RA Reed, RD Schrimpf, KM Warren, ...IEEE Transactions on Nuclear Science 57 (4), 1726-1746, 20102922010
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