Samah Mohamed A Saeed

Samah Mohamed A Saeed

City University of New York - New York / United States
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 4313012
City University of New York CUNY
person_outline Samah Mohamed A Saeed's MOST POPULAR ARTICLES
1-) Activation of logic encrypted chips: Pre-test or post-test?M Yasin, SM Saeed, J Rajendran, O Sinanoglu2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), 139-144, 2016652016
2-) Novel test-mode-only scan attack and countermeasure for compression-based scan architecturesSS Ali, SM Saeed, O Sinanoglu, R KarriIEEE transactions on computer-aided design of integrated circuits and …, 2015562015
3-) New scan-based attack using only the test modeSS Ali, O Sinanoglu, SM Saeed, R Karri2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration …, 2013492013
4-) CAD-Base: An attack vector into the electronics supply chainK Basu, SM Saeed, C Pilato, M Ashraf, MT Nabeel, K Chakrabarty, R KarriACM Transactions on Design Automation of Electronic Systems (TODAES) 24 (4 …, 2019532019
5-) Survey on quantum circuit compilation for noisy intermediate-scale quantum computers: Artificial intelligence to heuristicsJ Kusyk, SM Saeed, MU UyarIEEE Transactions on Quantum Engineering 2, 1-16, 2021432021