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Sandeep Jain
STMicroelectronics Pvt Ltd - /
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AD Scientific Index ID: 5596286
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Sandeep Jain's MOST POPULAR ARTICLES
1-)
Scan tests tolerant to indeterminate states when employing signature analysis to analyze test outputsS Jain, J AbrahamUS Patent 7,404,126, 2008262008
2-)
System and method for debugging scan chainsS Jain, N Krishnamoorthy, A Chaudhary, N Mahajan, S ChauhanUS Patent 8,458,541, 2013162013
3-)
Sequential scan based techniques to test interface between modules designed to operate at different frequenciesNSS Puvvada, N Krishnamoorthy, S Jain, J AbrahamUS Patent 7,421,634, 200892008
4-)
Enhancements in deterministic BIST implementations for improving test of complex SOCsS Jain, J Abraham, SK Vooka, S Kale, A Dutta, R Parekhji20th International Conference on VLSI Design held jointly with 6th …, 200772007
5-)
System and method for scan testing integrated circuitsS Jain, A Chaudhary, S JelokaUS Patent App. 12/954,907, 201252012
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