Seyab Khan

Seyab Khan

Delft University of Technology - Delft / Netherlands
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 4350357
Technische Universiteit Delft
person_outline Seyab Khan's MOST POPULAR ARTICLES
1-) Comparison of reaction-diffusion and atomistic trap-based BTI models for logic gatesH Kükner, S Khan, P Weckx, P Raghavan, S Hamdioui, B Kaczer, ...IEEE transactions on device and materials reliability 14 (1), 182-193, 2013682013
2-) Bias temperature instability analysis of FinFET based SRAM cellsS Khan, I Agbo, S Hamdioui, H Kukner, B Kaczer, P Raghavan, F Catthoor2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014602014
3-) BTI impact on logical gates in nano-scale CMOS technologyS Khan, S Hamdioui, H Kukner, P Raghavan, F Catthoor2012 IEEE 15th International Symposium on Design and Diagnostics of …, 2012522012
4-) Trends and challenges of SRAM reliability in the nano-scale eraS Khan, S Hamdioui5th International Conference on Design & Technology of Integrated Systems in …, 2010542010
5-) NBTI monitoring and design for reliability in nanoscale circuitsS Khan, NZ Haron, S Hamdioui, F Catthoor2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2011392011