Shuvanka Maji

Vidya Jyothi Institute of Technology - Hydarabad / India

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AD Scientific Index ID: 4808029

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Shuvanka Maji's MOST POPULAR ARTICLES

1-) Temperature impact on switching characteristics of resistive memory devices with HfOx/TiOx/HfOx stack dielectric R Mahapatra, S Maji, AB Horsfall, NG Wright Microelectronic Engineering 138, 118-121, 2015 212015

2-) Set compliance current induced resistive memory characteristics of W/Hf/HfOx/TiN devices S Maji, S Samanta, P Das, S Maikap, VR Dhanak, IZ Mitrovic, ... Journal of Vacuum Science & Technology B, Nanotechnology and …, 2019 102019

3-) Improved resistive switching performance of graphene oxide-based flexible ReRAM with HfOx buffer layerS Maji, AD Paul, P Das, S Chatterjee, P Chatterjee, VR Dhanak, ...Journal of Materials Science: Materials in Electronics 32, 2936-2945, 202192021

4-) Improved resistive switching characteristics of Ag/Al: HfO x/ITO/PET ReRAM for flexible electronics applicationAD Paul, S Biswas, P Das, HJ Edwards, A Dalal, S Maji, VR Dhanak, ...Semiconductor Science and Technology 36 (6), 065006, 202192021

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