Stephen Sunter

Mentor Graphics Corporation - / United States

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Stephen Sunter's MOST POPULAR ARTICLES

1-) A simplified polynomial-fitting algorithm for DAC and ADC BIST SK Sunter, N Nagi Proceedings International Test Conference 1997, 389-395, 1997 2071997

2-) BIST for phase-locked loops in digital applications S Sunter, A Roy International Test Conference 1999. Proceedings (IEEE Cat. No. 99CH37034 …, 1999 1771999

3-) Multiple clock rate test apparatus for testing digital systems B Nadeau-Dostie, ASM Hassan, DM Burek, SK Sunter US Patent 5,349,587, 1994 1511994

4-) Test metrics for analog parametric faultsS Sunter, N NagiProceedings 17th IEEE VLSI Test Symposium (Cat. No. PR00146), 226-234, 19991341999

5-) On-chip digital jitter measurement, from megahertz to gigahertzS Sunter, A RoyIEEE Design & Test of Computers 21 (4), 314-321, 20041142004

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