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Stuart Wright
Ametek, Inc. - Porto / United States
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AD Scientific Index ID: 4979026
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Stuart Wright's MOST POPULAR ARTICLES
1-)
A review of strain analysis using electron backscatter diffractionSI Wright, MM Nowell, DP FieldMicroscopy and Microanalysis 17 (03), 316-329, 201113092011
2-)
Orientation imaging: the emergence of a new microscopyBL Adams, SI Wright, K KunzeMetallurgical and Materials Transactions A 24 (4), 819-831, 199313071993
3-)
EBSD image quality mappingSI Wright, MM NowellMicroscopy and microanalysis 12 (1), 72-84, 20063592006
4-)
Automatic analysis of electron backscatter diffraction patternsSI Wright, BL AdamsMetallurgical and Materials Transactions A 23 (3), 759-767, 19923571992
5-)
Three-dimensional orientation microscopy in a focused ion beam–scanning electron microscope: A new dimension of microstructure characterizationS Zaefferer, SI Wright, D RaabeMetallurgical and Materials Transactions A 39 (2), 374-389, 20082712008
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