Sunghwan Hwang

Sunghwan Hwang

Xi'an Shiyou University - Xi'an / China
Engineering & Technology / Metallurgical & Materials Engineering
AD Scientific Index ID: 4478649
西安石油大学
person_outline Sunghwan Hwang's MOST POPULAR ARTICLES
1-) Measurement of stresses in Cu and Si around through-silicon via by synchrotron X-ray microdiffraction for 3-dimensional integrated circuitsAS Budiman, HAS Shin, BJ Kim, SH Hwang, HY Son, MS Suh, QH Chung, ...Microelectronics Reliability 52 (3), 530-533, 20121402012
2-) Microstructure evolution and defect formation in Cu through-silicon vias (TSVs) during thermal annealingHA Shin, BJ Kim, JH Kim, SH Hwang, AS Budiman, HY Son, KY Byun, ...Journal of Electronic Materials 41 (4), 712-719, 2012772012
3-) Containment materials for liquid tin at 1350° C as a heat transfer fluid for high temperature concentrated solar powerY Zhang, Y Cai, SH Hwang, G Wilk, F DeAngelis, A Henry, KH SandhageSolar Energy 164, 47-57, 2018242018
4-) Electrical and mechanical properties of through-silicon vias and bonding layers in stacked wafers for 3D integrated circuitsSH Hwang, BJ Kim, HY Lee, YC JooJournal of electronic materials 41, 232-240, 2012242012
5-) Towards the low-dose characterization of beam sensitive nanostructures via implementation of sparse image acquisition in scanning transmission electron microscopyS Hwang, CW Han, SV Venkatakrishnan, CA Bouman, V OrtalanMeasurement Science and Technology 28 (4), 045402, 2017232017