NEWS
Find a Professional: Explore Experts Across 197 Disciplines in 221 Countries!
Just Updated: Compare Your Institution (Live Data)
Print Your Certificate
New! Young University / Institution Rankings 2025
New! Art & Humanities Rankings 2025
New! Social Sciences and Humanities Rankings 2025
Highly Cited Researchers 2025 (Updated Today)
AD
Scientific Index 2025
Scientist Rankings
University Rankings
Subject Rankings
Country Rankings
Login
Register & Pricing
insights
H-Index Rankings
insights
i10 Productivity Rankings
format_list_numbered
Citation Rankings
subject
University Subject Rankings
school
Young Universities
format_list_numbered
Top 100 Scientists
format_quote
Top 100 Institutions
format_quote
For Students
local_fire_department
Country Reports
person
Find a Professional
Tao Yu
Massachusetts Institute of Technology - Cambridge / United States
Engineering & Technology / Computer Science
AD Scientific Index ID: 4303833
Registration, Add Profile,
Premium Membership
Get Your Global Impact Certificate
Ranking &
Analysis
Job
Experiences
Education
Information
Published Books
Book Chapters
Articles
Presentations
Lessons
Projects
Co-Authors
Subject Leaders
Editorship, Referee &
Scientific Board
Patents /
Designs
Academic Grants
& Awards
Artistic
Activities
Certificate / Course
/ Trainings
Association &
Society Memberships
Contact, Office
& Social Media
person_outline
Tao Yu's MOST POPULAR ARTICLES
1-)
A new self-aligned quantum-well MOSFET architecture fabricated by a scalable tight-pitch process 2013 IEEE International Electron Devices Meeting, 16.2. 1-16.2. 4, 2013
2-)
Investigation on variability in metal-gate Si nanowire MOSFETs: Analysis of variation sources and experimental characterization IEEE transactions on electron devices 58 (8), 2317-2325, 2011
3-)
Reducing power consumption for time-of-flight depth imaging US Patent 10,841,491, 2020
4-)
Investigations on line-edge roughness (LER) and line-width roughness (LWR) in nanoscale CMOS technology: Part I–modeling and simulation methodX Jiang, R Wang, T Yu, J Chen, R HuangIEEE Transactions on electron devices 60 (11), 3669-3675, 2013502013
5-)
Reducing power consumption for time-of-flight depth imagingC Mathy, S Demirtas, B Huo, D Gajaria, JA Goldberg, N Le Dortz, T Yu, ...US Patent 10,841,491, 2020492020
ARTICLES
Add your articles
We use cookies to personalize our website and offer you a better experience. If you accept cookies, we can offer you special services.
Cookie Policy
Accept