Teimuraz Mchedlidze Mtchedlidze

Teimuraz Mchedlidze Mtchedlidze

Technische Universität Bergakademie Freiberg - / Germany
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 1764781
Freiberg University of Mining and Technology
person_outline Teimuraz Mchedlidze Mtchedlidze's MOST POPULAR ARTICLES
1-) Residual stress in Si nanocrystals embedded in a matrixT Arguirov, T Mchedlidze, M Kittler, R Rölver, B Berghoff, M Först, ...Applied Physics Letters 89 (5), 053111, 2006862006
2-) The Direct Observation of Grown‐in Laser Scattering Tomography Defects in Czochralski SiliconM Nishimura, S Yoshino, H Motoura, S Shimura, T Mchedlidze, T HikoneJournal of the Electrochemical Society 143 (10), L243, 1996841996
3-) Regular dislocation networks in silicon as a tool for nanostructure devices used in optics, biology, and electronicsM Kittler, X Yu, T Mchedlidze, T Arguirov, OF Vyvenko, W Seifert, ...Small 3 (6), 964-973, 2007802007
4-) Influence of dislocation loops on the near-infrared light emission from silicon diodesT Hoang, J Holleman, P LeMinh, J Schmitz, T Mchedlidze, T Arguirov, ...IEEE transactions on electron devices 54 (8), 1860-1866, 2007402007
5-) Temperature dependence of conduction by reconstructured dislocations in silicon and nonlinear effectsVV Kveder, AE Koshelev, T Mchedlidze, AIS Yu. A. Osip’yanZh. Éksp. Teor. Fiz 83 (2), 699, 198936*1989