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Todd Hubing
Clemson University - Clemson / United States
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 900404
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Todd Hubing's MOST POPULAR ARTICLES
1-)
The electromagnetic compatibility of integrated circuits—Past, present, and future IEEE Transactions on Electromagnetic Compatibility 51 (1), 78-100, 2009
2-)
EMI from cavity modes of shielding enclosures-FDTD modeling and measurements IEEE Transactions on Electromagnetic Compatibility 42 (1), 29-38, 2000
3-)
Quantifying EMI resulting from finite-impedance reference planes IEEE Transactions on Electromagnetic Compatibility 39 (4), 286-297, 1997
4-)
Comparison of FDTD algorithms for subcellular modeling of slots in shielding enclosures IEEE Transactions on Electromagnetic Compatibility 39 (2), 147-155, 1997
5-)
Quantifying SMT decoupling capacitor placement in DC power-bus design for multilayer PCBsJ Fan, JL Drewniak, JL Knighten, NW Smith, A Orlandi, TP Van Doren, ...IEEE Transactions on Electromagnetic Compatibility 43 (4), 588-599, 20011432001
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