Trey Reece

Trey Reece

Vanderbilt University - Nashville / United States
Engineering & Technology / Computer Science
AD Scientific Index ID: 1362641
person_outline Trey Reece's MOST POPULAR ARTICLES
1-) Neutron-and proton-induced single event upsets for D-and DICE-flip/flop designs at a 40 nm technology nodeTD Loveless, S Jagannathan, T Reece, J Chetia, BL Bhuva, MW McCurdy, ...Nuclear Science, IEEE Transactions on 58 (3), 1008-1014, 20111692011
2-) On-chip measurement of single-event transients in a 45 nm silicon-on-insulator technologyTD Loveless, JS Kauppila, S Jagannathan, DR Ball, JD Rowe, ...Nuclear Science, IEEE Transactions on 59 (6), 2748-2755, 2012512012
3-) Technology scaling comparison of flip-flop heavy-ion single-event upset cross sectionsNJ Gaspard, S Jagannathan, ZJ Diggins, MP King, SJ Wen, R Wong, ...Nuclear Science, IEEE Transactions on 60 (6), 4368-4373, 2013482013
4-) Analysis of data-leak hardware Trojans in AES cryptographic circuitsT Reece, WH RobinsonTechnologies for Homeland Security (HST), 2013 IEEE International Conference …, 2013402013
5-) Design comparison to identify malicious hardware in external intellectual propertyT Reece, DB Limbrick, WH RobinsonTrust, Security and Privacy in Computing and Communications (TrustCom), 2011 …, 2011292011