Ugo Russo

Ugo Russo

Micron Technology Inc - - / United States
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 4524260
-
person_outline Ugo Russo's MOST POPULAR ARTICLES
1-) Self-accelerated thermal dissolution model for reset programming in unipolar resistive-switching memory (RRAM) devicesU Russo, D Ielmini, C Cagli, AL LacaitaIEEE Transactions on Electron Devices 56 (2), 193-200, 20094842009
2-) Filament conduction and reset mechanism in NiO-based resistive-switching memory (RRAM) devicesU Russo, D Ielmini, C Cagli, AL LacaitaIEEE Transactions on Electron Devices 56 (2), 186-192, 20093892009
3-) Study of multilevel programming in programmable metallization cell (PMC) memoryU Russo, D Kamalanathan, D Ielmini, AL Lacaita, MN KozickiIEEE transactions on electron devices 56 (5), 1040-1047, 20093582009
4-) Conductive-filament switching analysis and self-accelerated thermal dissolution model for reset in NiO-based RRAMU Russo, D Ielmini, C Cagli, AL Lacaita, S Spiga, C Wiemer, M Perego, ...2007 IEEE International Electron Devices Meeting, 775-778, 20072682007
5-) Modeling of programming and read performance in phase-change memories—Part I: Cell optimization and scalingU Russo, D Ielmini, A Redaelli, AL LacaitaIEEE Transactions on Electron Devices 55 (2), 506-514, 20081472008