Victor Sonnenberg

Victor Sonnenberg

Universidade de São Paulo USP - São Paulo / Brazil
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 5251900
University of São Paulo USP
person_outline Victor Sonnenberg's MOST POPULAR ARTICLES
1-) SOI technology characterization using SOI-MOS capacitorV Sonnenberg, JA MartinoSolid-state electronics 49 (1), 109-116, 2005132005
2-) Analysis of transition region and accumulation layer effect in the subthreshold slope in SOI nMOSFETs and their influences on the interface trap density extractionV Sonnenberg, JA MartinoSolid-State Electronics 43 (12), 2191-2199, 199991999
3-) Physical and electrical characterization of thin nickel films obtained from electroless plating onto aluminumAEB Marques, SG dos Santos Filho, AR Navia, V Sonnenberg, JA Martinophysica status solidi (a) 187 (1), 75-84, 200172001
4-) Influence of accumulation layer on interface trap density extractionV Sonnenberg, JA MartinoElectronics Letters 34 (25), 2439-2441, 199861998
5-) Analysis of the Silicon Film Thickness and the Ground Plane Influence on Ultra Thin Buried Oxide SOI nMOSFETsVT Itocazu, V Sonnenberg, E Simoen, C Claeys, JA MartinoECS Transactions 49 (1), 511, 201252012