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Vivek Chickermane
Cadence Design Systems - / United States
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AD Scientific Index ID: 4964264
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Vivek Chickermane's MOST POPULAR ARTICLES
1-)
An optimization based approach to the partial scan design problem V Chickermane, JH Patel Proceedings. International Test Conference 1990, 377-386, 1990 1881990
2-)
A fault oriented partial scan design approach V Chickermane, JH Patel 1991 IEEE International Conference on Computer-Aided Design Digest of …, 1991 1521991
3-)
Channel masking synthesis for efficient on-chip test compression V Chickermane, B Foutz, B Keller 2004 International Conferce on Test, 452-461, 2004 1412004
4-)
Non-scan design-for-testability techniques for sequential circuitsV Chickermane, EM Rudnick, P Banerjee, JH PatelProceedings of the 30th international Design Automation Conference, 236-241, 1993681993
5-)
Test and debug strategy for TSMC CoWoS™ stacking process based heterogeneous 3D IC: A silicon case studySK Goel, S Adham, MJ Wang, JJ Chen, TC Huang, A Mehta, F Lee, ...2013 IEEE International Test Conference (ITC), 1-10, 2013492013
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