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Wei Ren
National Institute of Standards and Technology - Maryland / United States
Engineering & Technology / Computer Science
AD Scientific Index ID: 5718021
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Wei Ren's MOST POPULAR ARTICLES
1-)
Performance evaluation experiments on a laser spot triangulation probeB Muralikrishnan, W Ren, D Everett, E Stanfield, T DoironMeasurement 45 (3), 333-343, 2012522012
2-)
Assessing ranging errors as a function of azimuth in laser trackers and tracersB Muralikrishnan, V Lee, C Blackburn, D Sawyer, S Phillips, W Ren, ...Measurement Science and Technology 24 (6), 065201, 2013252013
3-)
X-ray computed tomography instrument performance evaluation, Part I: Sensitivity to detector geometry errorsB Muralikrishnan, M Shilling, S Phillips, W Ren, V Lee, F KimJournal of Research of the National Institute of Standards and Technology …, 2019232019
4-)
Toward the development of a documentary standard for derived-point to derived-point distance performance evaluation of spherical coordinate 3D imaging systemsB Muralikrishnan, M Shilling, P Rachakonda, W Ren, V Lee, D SawyerJournal of Manufacturing Systems 37, 550-557, 2015182015
5-)
Physical Models and Dimensional Traceability of WR15 Rectangular Waveguide Standards for Determining Systematic Uncertainties of Calibrated Scattering-ParametersJA Jargon, DF Williams, AC Stelson, CJ Long, AM Hagerstrom, PD Hale, ...152020
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