Weichang Xie

Weichang Xie

Carl Zeiss AG - Oberkochen / Germany
Natural Sciences / Physics
AD Scientific Index ID: 4442803
person_outline Weichang Xie's MOST POPULAR ARTICLES
1-) Fundamental aspects of resolution and precision in vertical scanning white-light interferometryP Lehmann, S Tereschenko, W XieSurface Topography: Metrology and Properties 4 (2), 024004, 2016672016
2-) Lateral resolution and transfer characteristics of vertical scanning white-light interferometersW Xie, P Lehmann, J NiehuesApplied optics 51 (11), 1795-1803, 2012542012
3-) Signal modeling in low coherence interference microscopy on example of rectangular gratingW Xie, P Lehmann, J Niehues, S TereschenkoOptics express 24 (13), 14283-14300, 2016292016
4-) Coherence scanning and phase imaging optical interference microscopy at the lateral resolution limitP Lehmann, W Xie, B Allendorf, S TereschenkoOptics express 26 (6), 7376-7389, 2018402018
5-) Transfer characteristics of white light interferometers and confocal microscopesW XieDissertation, Kassel, Universität Kassel, 2017, 2017352017