Weiping Shi

Weiping Shi

Texas A&M University - College Station / United States
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 1674902
person_outline Weiping Shi's MOST POPULAR ARTICLES
1-) K longest paths per gate (KLPG) test generation for scan-based sequential circuitsW Qiu, J Wang, DMH Walker, D Reddy, X Lu, Z Li, W Shi, H BalachandranTest Conference, 2004. Proceedings. ITC 2004. International, 223-231, 20041492004
2-) A fast hierarchical algorithm for three-dimensional capacitance extractionW Shi, J Liu, N Kakani, T YuIEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 20021312002
3-) The rectilinear Steiner arborescence problem is NP-completeW Shi, C SuSIAM Journal on Computing 35 (3), 729-740, 20051122005
4-) Longest-path selection for delay test under process variationX Lu, Z Li, W Qiu, DMH Walker, W ShiIEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 20051102005
5-) Fast algorithms for slew constrained minimum cost bufferingS Hu, CJ Alpert, J Hu, S Karandikar, Z Li, W Shi, CN SzeProceedings of the 43rd annual Design Automation Conference, 308-313, 20061032006