Willi Volksen

Willi Volksen

IBM Corporation - New York / United States
Engineering & Technology / Metallurgical & Materials Engineering
AD Scientific Index ID: 4465727
person_outline Willi Volksen's MOST POPULAR ARTICLES
1-) A buckling-based metrology for measuring the elastic moduli of polymeric thin filmsCM Stafford, C Harrison, KL Beers, A Karim, EJ Amis, ...Nature materials 3 (8), 545-550, 200414212004
2-) Low dielectric constant materialsW Volksen, RD Miller, G DuboisChemical reviews 110 (1), 56-110, 20107762010
3-) Templating nanoporosity in thin‐film dielectric insulatorsJL Hedrick, RD Miller, CJ Hawker, KR Carter, W Volksen, DY Yoon, ...Advanced Materials 10 (13), 1049-1053, 19984251998
4-) Aqueous solution properties of a poly (vinyl imidazolium sulphobetaine)JC Salamone, W Volksen, AP Olson, SC IsraelPolymer 19 (10), 1157-1162, 19782961978
5-) Well-defined random copolymers by a “living” free-radical polymerization processCJ Hawker, E Elce, J Dao, W Volksen, TP Russell, GG BarclayMacromolecules 29 (7), 2686-2688, 19962921996