William H Robinson

William H Robinson

Vanderbilt University - Nashville / United States
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 1326009
person_outline William H Robinson's MOST POPULAR ARTICLES
1-) Characterization of digital single event transient pulse-widths in 130-nm and 90-nm CMOS technologies IEEE Transactions on Nuclear Science 54 (6), 2506-2511, 2007
2-) Securing commercial WiFi-based UAVs from common security attacks MILCOM 2016-2016 IEEE Military Communications Conference, 1213-1218, 2016
3-) On-chip characterization of single-event transient pulsewidths IEEE Transactions on Device and Materials Reliability 6 (4), 542-549, 2006
4-) Modeling of Single Event Transients With Dual Double-Exponential Current Sources: Implications for Logic Cell Characterization IEEE Transactions on Nuclear Science 62 (4), 1540-1549, 2015
5-) Using benchmarks for radiation testing of microprocessors and FPGAs IEEE transactions on nuclear science 62 (6), 2547-2554, 2015