William H Robinson

William H Robinson

Vanderbilt University - Nashville / United States
Engineering & Technology / Electrical & Electronic Engineering
AD Scientific Index ID: 1326009
person_outline William H Robinson's MOST POPULAR ARTICLES
1-) Characterization of digital single event transient pulse-widths in 130-nm and 90-nm CMOS technologiesB Narasimham, BL Bhuva, RD Schrimpf, LW Massengill, MJ Gadlage, ...IEEE Transactions on Nuclear Science 54 (6), 2506-2511, 20072142007
2-) Securing commercial WiFi-based UAVs from common security attacksM Hooper, Y Tian, R Zhou, B Cao, AP Lauf, L Watkins, WH Robinson, ...MILCOM 2016-2016 IEEE Military Communications Conference, 1213-1218, 20161772016
3-) On-chip characterization of single-event transient pulsewidthsB Narasimham, V Ramachandran, BL Bhuva, RD Schrimpf, AF Witulski, ...IEEE Transactions on Device and Materials Reliability 6 (4), 542-549, 20061732006
4-) Modeling of Single Event Transients With Dual Double-Exponential Current Sources: Implications for Logic Cell CharacterizationD Black, WH Robinson, IZ Wilcox, DB Limbrick, JD BlackIEEE Transactions on Nuclear Science 62 (4), 1540-1549, 20151412015
5-) Using benchmarks for radiation testing of microprocessors and FPGAsH Quinn, WH Robinson, P Rech, M Aguirre, A Barnard, M Desogus, ...IEEE transactions on nuclear science 62 (6), 2547-2554, 20151222015