Xiaochun Yu

Xiaochun Yu

Intel Corporation - California / United States
Others
AD Scientific Index ID: 4533601
-
person_outline Xiaochun Yu's MOST POPULAR ARTICLES
1-) Test-data volume optimization for diagnosisH Wang, O Poku, X Yu, S Liu, I Komara, RD BlantonDesign Automation Conference (DAC), 2012 49th ACM/EDAC/IEEE, 567-572, 2012582012
2-) An effective and flexible multiple defect diagnosis methodology using error propagation analysisX Yu, RD BlantonTest Conference, 2008. ITC 2008. IEEE International, 1-9, 2008442008
3-) Controlling DPPM through volume diagnosisX Yu, YT Lin, WC Tam, O Poku, RD BlantonVLSI Test Symposium, 2009. VTS\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\\'09. 27th IEEE, 134-139, 2009382009
4-) Estimating defect-type distributions through volume diagnosis and defect behavior attributionX Yu, RD BlantonTest Conference (ITC), 2010 IEEE International, 1-10, 2010382010
5-) Yield Learning Through Physically Aware Diagnosis of IC-Failure PopulationsRD Blanton, WC Tam, X Yu, JE Nelson, O PokuDesign & Test of Computers, IEEE 29 (1), 36-47, 2012342012