Yik Yee Tan

ON Semiconductor - Montreal / United States

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AD Scientific Index ID: 4969988

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Yik Yee Tan's MOST POPULAR ARTICLES

1-) Recursive sub-image histogram equalization applied to gray scale images KS Sim, CP Tso, YY Tan Pattern Recognition Letters 28 (10), 1209-1221, 2007 5702007

2-) Reducing scanning electron microscope charging by using exponential contrast stretching technique on post‐processing imagesKS Sim, YY Tan, MA Lai, CP Tso, WK LimJournal of Microscopy 238 (1), 44-56, 2010

3-) Cu-Al IMC micro structure study in Cu wire bonding with TEMYY Tan, FK Yong2010 17th IEEE International Symposium on the Physical and Failure Analysis …, 2010

4-) Cu–Al intermetallic compound investigation using ex-situ post annealing and in-situ annealingYY Tan, QL Yang, KS Sim, LT Sun, X WuMicroelectronics Reliability 55 (11), 2316-2323, 2015132015

5-) A study on central moments of the histograms from scanning electron microscope charging imagesYY Tan, KS Sim, CP TsoScanning: The Journal of Scanning Microscopies 29 (5), 211-218, 2007112007

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