Young-Sik Ghim

Young-Sik Ghim

Korea Research Institute of Standards and Science - / South Korea
Others
AD Scientific Index ID: 4407857
한국 표준 과학 연구소
person_outline Young-Sik Ghim's MOST POPULAR ARTICLES
1-) Thin-film thickness profile and its refractive index measurements by dispersive white-light interferometryYS Ghim, SW KimOptics express 14 (24), 11885-11891, 2006982006
2-) Fast, precise, tomographic measurements of thin filmsYS Ghim, SW KimApplied physics letters 91 (9), 091903, 2007662007
3-) Spectrally resolved white-light interferometry for 3D inspection of a thin-film layer structureYS Ghim, SW KimApplied optics 48 (4), 799-803, 2009562009
4-) Complete fringe order determination in scanning white-light interferometry using a Fourier-based techniqueYS Ghim, A DaviesApplied Optics 51 (12), 1922-1928, 2012552012
5-) 3D surface mapping of freeform optics using wavelength scanning lateral shearing interferometryYS Ghim, HG Rhee, A Davies, HS Yang, YW LeeOptics express 22 (5), 5098-5105, 2014542014