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Yuan-Fu Yang
Taiwan Semiconductor Manufacturing Company Ltd. - Hsinchu / Taiwan
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AD Scientific Index ID: 5402145
台湾半导体制造公司有限公司
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Yuan-Fu Yang's MOST POPULAR ARTICLES
1-)
A deep learning model for identification of defect patterns in semiconductor wafer mapY Yuan-Fu2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC …, 2019562019
2-)
Semiconductor defect detection by hybrid classical-quantum deep learningYF Yang, M SunProceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2022322022
3-)
Double feature extraction method for wafer map classification based on convolution neural networkY Yuan-Fu, S Min2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC …, 2020172020
4-)
A Novel Deep Learning Architecture for Global Defect Classification: Self-Proliferating Neural Network (SPNet)YF Yang, M Sun2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC …, 202172021
5-)
Semiconductor defect pattern classification by self-proliferation-and-attention neural networkY Yang, M SunIEEE Transactions on Semiconductor Manufacturing 35 (1), 16-23, 202152021
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