Yuzo Fukuzaki

Sony Corporation - Tokyo / Japan

Others

AD Scientific Index ID: 4522323

Registration, Add Profile,
Premium Membership

Print Your Certificate

Yuzo Fukuzaki's MOST POPULAR ARTICLES

1-) Advanced analysis and modeling of MOSFET characteristic fluctuation caused by layout variationH Tsuno, K Anzai, M Matsumura, S Minami, A Honjo, H Koike, Y Hiura, ...2007 IEEE Symposium on VLSI Technology, 204-205, 2007642007

2-) Empirical characteristics and extraction of overall variations for 65-nm MOSFETs and beyondM Kanno, A Shibuya, M Matsumura, K Tamura, H Tsuno, S Mori, ...2007 IEEE symposium on VLSI technology, 88-89, 2007332007

3-) Extending trench DRAM technology to 0.15/spl mu/m groundrule and beyondT Rupp, N Chaudhary, K Dev, Y Fukuzaki, J Gambino, H Ho, J Iba, E Ito, ...International Electron Devices Meeting 1999. Technical Digest (Cat. No …, 1999141999

4-) IEDM Tech. Dig.T Rupp, N Chaudhary, K Dev, Y Fukuzaki, J Gambino, H HoIEDM Tech Dig, 33, 1999

5-) Fully compatible integration of high density embedded dram with 65nm CMOS technology (CMOS5)Y Matsubara, M Habu, S Matsuda, K Honda, E Morifuji, T Yoshida, ...IEEE International Electron Devices Meeting 2003, 17.5. 1-17.5. 4, 2003

ARTICLES

Add your articles