Yves Ousten

Yves Ousten

Université de Bordeaux - Bordeaux / France
Engineering & Technology / Mechanical Engineering
AD Scientific Index ID: 925822
University of Bordeaux
person_outline Yves Ousten's MOST POPULAR ARTICLES
1-) High temperature reliability testing of aluminum and tantalum electrolytic capacitorsA Dehbi, W Wondrak, Y Ousten, Y DantoMicroelectronics Reliability 42 (6), 835-840, 2002562002
2-) Detection and location of defects in electronic devices by means of scanning ultrasonic microscopy and the wavelet transformL Angrisani, L Bechou, D Dallet, P Daponte, Y OustenMeasurement 31 (2), 77-91, 2002562002
3-) Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analysesR Baillot, Y Deshayes, L Bechou, T Buffeteau, I Pianet, C Armand, ...Microelectronics reliability 50 (9-11), 1568-1573, 2010282010
4-) Vibration lifetime modelling of PCB assemblies using Steinberg modelA Dehbi, Y Ousten, Y Danto, W WondrakMicroelectronics Reliability 45 (9-11), 1658-1661, 2005262005
5-) Ultrasonic images interpretation improvement for microassembling technologies characterisationL Bechou, Y Ousten, B Tregon, F Marc, Y Danto, R Even, P KerteszMicroelectronics Reliability 37 (10-11), 1787-1790, 1997241997