AD Scientific Index (Alper-Doger Scientific Index) offers the broadest spectrum of branches, providing analysis in 13 main fields and 197 sub-branches at global, national, and regional levels. These analyses can be based on indicators such as the H-index, i10-index, and citation count, as well as their values from the last 6 years. As of Nov 08, 2024, rankings are according to the Total H Index. BETA VERSION: The subject field rankings for the world, regions, countries, and universities are currently in beta. This is due to the exclusion of (901.403) scientists categorized under 'others,' whose profiles cannot yet be determined, edited, or classified. As these fields are updated, the rankings will adjust accordingly. Please keep this in mind. See Also: [University Subject Rankings]
* Total H IndexRankings
Ranking Based On Selection
:1
single frequency laser
gravitational wave detection
Metrics
H-Index
i10 Index
Citation Counts
139
298
124,780
* Total H IndexRankings
Ranking Based On Selection
:2
Ferroelectrics
Metrics
H-Index
i10 Index
Citation Counts
56
343
16,543
* Total H IndexRankings
Ranking Based On Selection
:3
Nanotechnology
material science
lasers
material processing
Metrics
H-Index
i10 Index
Citation Counts
43
129
5,611
* Total H IndexRankings
Ranking Based On Selection
:4
Spectroscopy of molecules & nanoscale systems
Metrics
H-Index
i10 Index
Citation Counts
38
110
5,996
* Total H IndexRankings
Ranking Based On Selection
:5
Additive Manufacturing
Laser Material processing
Technology Incubation.
Metrics
H-Index
i10 Index
Citation Counts
37
82
5,099
* Total H IndexRankings
Ranking Based On Selection
:6
Computational Materials Science
Metrics
H-Index
i10 Index
Citation Counts
35
87
4,039
* Total H IndexRankings
Ranking Based On Selection
:7
Biophotonics
Metrics
H-Index
i10 Index
Citation Counts
35
54
3,524
* Total H IndexRankings
Ranking Based On Selection
:8
nonlinear optics
nanoparticles
fiber laser
Metrics
H-Index
i10 Index
Citation Counts
34
91
3,796
* Total H IndexRankings
Ranking Based On Selection
:9
Mechanical Engineering
Metrics
H-Index
i10 Index
Citation Counts
32
97
4,746
* Total H IndexRankings
Ranking Based On Selection
:10
RF and Microwave Solid-State Amplifier
Metrics
H-Index
i10 Index
Citation Counts
31
123
5,739
* Total H IndexRankings
Ranking Based On Selection
:11
Laser processing
microstructural analysis
joining
Metrics
H-Index
i10 Index
Citation Counts
30
66
2,850
* Total H IndexRankings
Ranking Based On Selection
:12
Interest: Magnetic
electrical and thermal properties of magnetic materials and superconductors.
Metrics
H-Index
i10 Index
Citation Counts
30
70
3,806
* Total H IndexRankings
Ranking Based On Selection
:13
interface study of metal and oxide thinfilms and multilayer
Metal alloy corrosion
Solid Electrolyte Interphase (SEI) formation
Metrics
H-Index
i10 Index
Citation Counts
28
70
2,635
* Total H IndexRankings
Ranking Based On Selection
:14
Synchrotron
X-ray diffraction
Thin film growth
X-ray reflectivity
Residual stress analysis
Metrics
H-Index
i10 Index
Citation Counts
25
66
2,641
* Total H IndexRankings
Ranking Based On Selection
:15
Metrics
H-Index
i10 Index
Citation Counts
24
48
1,856
* Total H IndexRankings
Ranking Based On Selection
:16
Electron Microscopy
Nanoscience
Lithography
Metal oxide
X-ray reflectivity
Metrics
H-Index
i10 Index
Citation Counts
24
52
2,377
* Total H IndexRankings
Ranking Based On Selection
:17
Materials joining
Optical Microscopy
Mechanical testing
laser additive manufacturing
laser peening
Metrics
H-Index
i10 Index
Citation Counts
24
52
2,610
* Total H IndexRankings
Ranking Based On Selection
:18
Chemical sensors using polymer FET
Pulse laser nano-structure fabrication
Metrics
H-Index
i10 Index
Citation Counts
24
76
2,894
* Total H IndexRankings
Ranking Based On Selection
:19
X-ray fluorescence
TXRF X-ray reflectivity
X-ray standing wave
Metrics
H-Index
i10 Index
Citation Counts
23
52
1,685
* Total H IndexRankings
Ranking Based On Selection
:20
Material science
Metrics
H-Index
i10 Index
Citation Counts
22
54
2,043
* Total H IndexRankings
Ranking Based On Selection
:21
Material Science
Metrics
H-Index
i10 Index
Citation Counts
22
43
1,387
* Total H IndexRankings
Ranking Based On Selection
:22
Laser Plasma interaction
Metrics
H-Index
i10 Index
Citation Counts
22
28
1,469
* Total H IndexRankings
Ranking Based On Selection
:23
Laser Produced Plasma
Plasma Diagnostics
Magnetic Confinement of Plasma
Spectroscopy
Radiation
Metrics
H-Index
i10 Index
Citation Counts
21
56
1,756
* Total H IndexRankings
Ranking Based On Selection
:24
ADXRD Beamline
Indus - 2
Metrics
H-Index
i10 Index
Citation Counts
21
38
1,111
* Total H IndexRankings
Ranking Based On Selection
:25
Semiconductor Physics & Devices
Quantum Materials
Epitaxy
III-V/Nitrides
Spectroscopy
Metrics
H-Index
i10 Index
Citation Counts
21
53
1,543
Jogy George
Metrics
H-Index
i10-Index
Citation Counts
139
298
124,780
Gurvinderjit Singh
Metrics
H-Index
i10-Index
Citation Counts
56
343
16,543
Lm Kukreja
Metrics
H-Index
i10-Index
Citation Counts
43
129
5,611
Nanotechnology
material science
lasers
material processing
Kaustuv Das
Metrics
H-Index
i10-Index
Citation Counts
38
110
5,996
CP Paul
Metrics
H-Index
i10-Index
Citation Counts
37
82
5,099
Additive Manufacturing
Laser Material processing
Technology Incubation.
Aparna Chakrabarti
Metrics
H-Index
i10-Index
Citation Counts
35
87
4,039
Computational Materials Science
Shovan K Majumder
Metrics
H-Index
i10-Index
Citation Counts
35
54
3,524
Kushvinder Singh Bindra
Metrics
H-Index
i10-Index
Citation Counts
34
91
3,796
Akhilesh Jain
Metrics
H-Index
i10-Index
Citation Counts
31
123
5,739
Rakesh Kaul
Metrics
H-Index
i10-Index
Citation Counts
30
66
2,850
Maulindu Kumar Chattopadhyay
Metrics
H-Index
i10-Index
Citation Counts
30
70
3,806
Interest: Magnetic
electrical and thermal properties of magnetic materials and superconductors.
Parasmani Rajput
Metrics
H-Index
i10-Index
Citation Counts
28
70
2,635
interface study of metal and oxide thinfilms and multilayer
Metal alloy corrosion
Solid Electrolyte Interphase (SEI) formation
Sanjay Kumar Rai
Metrics
H-Index
i10-Index
Citation Counts
25
66
2,641
Synchrotron
X-ray diffraction
Thin film growth
X-ray reflectivity
Residual stress analysis
Archna Sagdeo
Metrics
H-Index
i10-Index
Citation Counts
24
48
1,856
Pragya Tiwari
Metrics
H-Index
i10-Index
Citation Counts
24
52
2,377
Electron Microscopy
Nanoscience
Lithography
Metal oxide
X-ray reflectivity
P Ganesh
Metrics
H-Index
i10-Index
Citation Counts
24
52
2,610
Materials joining
Optical Microscopy
Mechanical testing
laser additive manufacturing
laser peening
Ravi Shanker Verma
Metrics
H-Index
i10-Index
Citation Counts
24
76
2,894
Chemical sensors using polymer FET
Pulse laser nano-structure fabrication
MK Tiwari
Metrics
H-Index
i10-Index
Citation Counts
23
52
1,685
Srinibas Satapathy
Metrics
H-Index
i10-Index
Citation Counts
22
54
2,043
Rs Ajimsha
Metrics
H-Index
i10-Index
Citation Counts
22
43
1,387
Himanshu Singhal
Metrics
H-Index
i10-Index
Citation Counts
22
28
1,469
Virendra Nath Rai
Metrics
H-Index
i10-Index
Citation Counts
21
56
1,756
Laser Produced Plasma
Plasma Diagnostics
Magnetic Confinement of Plasma
Spectroscopy
Radiation
MN Singh
Metrics
H-Index
i10-Index
Citation Counts
21
38
1,111
Tarun Kumar Sharma
Metrics
H-Index
i10-Index
Citation Counts
21
53
1,543
Semiconductor Physics & Devices
Quantum Materials
Epitaxy
III-V/Nitrides
Spectroscopy