Top 100 scientists can be ranked globally or specific to the following regions including Africa, Asia, Europe, North America, Latin America, Oceania, Arab League, ASEAN, EECA, and BRICS based on total H-index scores without any breakdown by subject areas. Top 100 rankings in the world, in a continent, or a region include standardized subjects areas of Agriculture & Forestry, Arts, Design and Architecture, Business & Management, Economics & Econometrics, Education, Engineering & Technology, History, Philosophy, Theology, Law/Law and Legal Studies, Medical and Health Sciences, Natural Sciences, Social Sciences, Art and Humanities Rankings and Social Sciences and Humanities Rankings BETA VERSION. Subject field ranking in world, region, country and university is beta version since subject field "others" (873,690 scientists profile whose branch cannot be determined, not yet edited or determined) is excluded, so the ranking will change as the others fields are edited. Please note that. Subjects indicated as “ * others ” will not be included in the ranking by regions and subjects.
Metrics
H-Index
i10 Index
Citation
41
101
5,964
IoT
connectivity
sensors
sensor fusion
innovation management
Metrics
H-Index
i10 Index
Citation
39
62
4,298
Microlithography for integrated circuit production
Metrics
H-Index
i10 Index
Citation
39
113
5,804
EUV
Metrics
H-Index
i10 Index
Citation
38
155
6,255
materials science
patterning
devices
systems
life sciences
Metrics
H-Index
i10 Index
Citation
37
88
4,065
Metrics
H-Index
i10 Index
Citation
32
69
6,180
Correlated electron systems
Lithography
Metrics
H-Index
i10 Index
Citation
31
44
5,390
lithography
Metrics
H-Index
i10 Index
Citation
30
84
3,113
photonics
nanotechnology
optics
Metrics
H-Index
i10 Index
Citation
30
46
4,784
* Rankings
Ranking Based
On Selection: 10
Lithography
Metrology
Photomasks
Amorphous Materials
Polymer Chemistry/Dynamics
Metrics
H-Index
i10 Index
Citation
30
61
3,243
* Rankings
Ranking Based
On Selection: 11
Nanophotonics
Metrics
H-Index
i10 Index
Citation
29
40
3,138
* Rankings
Ranking Based
On Selection: 12
physical chemistry
nanotechnology
laser spectroscopy
cancer research and drug delivery
EUV
Metrics
H-Index
i10 Index
Citation
29
54
3,052
* Rankings
Ranking Based
On Selection: 13
Thin films
optical modeling
interference coatings
Nano science and technology
Nano catalysis
Metrics
H-Index
i10 Index
Citation
29
31
4,422
* Rankings
Ranking Based
On Selection: 14
photolithography
simulation
photoresist
Metrics
H-Index
i10 Index
Citation
29
69
3,437
* Rankings
Ranking Based
On Selection: 15
EUV
Lithography
Plasma
Metrics
H-Index
i10 Index
Citation
25
50
2,678
* Rankings
Ranking Based
On Selection: 16
Quantum Coherent Control
Ultrafast Nonlinear Optics
Photonic Crystal Fibres
Coherent Raman Interaction
Spectroscopy
Metrics
H-Index
i10 Index
Citation
25
33
2,643
* Rankings
Ranking Based
On Selection: 17
DUV EUV lithography
computational lithography
source mask optimization
multiple patterning
resolution enhancement technique
Metrics
H-Index
i10 Index
Citation
25
62
2,071
* Rankings
Ranking Based
On Selection: 18
Metrics
H-Index
i10 Index
Citation
24
31
2,502
* Rankings
Ranking Based
On Selection: 19
comsol
matlab
simulink
modeling
simulation
Metrics
H-Index
i10 Index
Citation
24
49
2,658
* Rankings
Ranking Based
On Selection: 20
Optische lithografie
warmte en stroming
Metrics
H-Index
i10 Index
Citation
24
38
2,116
* Rankings
Ranking Based
On Selection: 21
Thin films
MEMS
Metrics
H-Index
i10 Index
Citation
21
29
2,053
* Rankings
Ranking Based
On Selection: 22
EUV Lithography
laser produced plasma
Metrics
H-Index
i10 Index
Citation
21
31
1,852
* Rankings
Ranking Based
On Selection: 23
Metrics
H-Index
i10 Index
Citation
21
28
4,363
* Rankings
Ranking Based
On Selection: 24
Quantum Optics
Condensed Matter Physics
Quantum Field Theory
Metrics
H-Index
i10 Index
Citation
21
24
1,627
* Rankings
Ranking Based
On Selection: 25
Machine learning
Pattern recognition
Data mining
Lithography
Metrics
H-Index
i10 Index
Citation
21
31
1,930
* Rankings
Ranking Based
On Selection: 26
atomic spectroscopy
optical frequency standards
lithography
plasma physics
Metrics
H-Index
i10 Index
Citation
21
38
2,040
* Rankings
Ranking Based
On Selection: 27
Semiconductor lithography
metrology
and inspection
Metrics
H-Index
i10 Index
Citation
21
35
2,024
* Rankings
Ranking Based
On Selection: 28
Fluid Mechanics
CFD
Renewable Energy
Flow Control
Metrics
H-Index
i10 Index
Citation
20
24
2,888
* Rankings
Ranking Based
On Selection: 29
Metrics
H-Index
i10 Index
Citation
20
25
1,680
* Rankings
Ranking Based
On Selection: 30
X-ray optics
optical design
optical metrology
differential deposition
Metrics
H-Index
i10 Index
Citation
19
35
1,410
* Rankings
Ranking Based
On Selection: 31
Metrics
H-Index
i10 Index
Citation
19
26
2,576
* Rankings
Ranking Based
On Selection: 32
Metrics
H-Index
i10 Index
Citation
19
29
1,430
* Rankings
Ranking Based
On Selection: 33
Metrics
H-Index
i10 Index
Citation
19
22
1,093
* Rankings
Ranking Based
On Selection: 34
Nanotechnology
Materials Science
Contamination Control
Additive Manufacturing
Metrics
H-Index
i10 Index
Citation
18
20
1,435
* Rankings
Ranking Based
On Selection: 35
Optical Engineering
Metrics
H-Index
i10 Index
Citation
18
24
1,423
* Rankings
Ranking Based
On Selection: 36
Applied Optics
Metrics
H-Index
i10 Index
Citation
18
24
1,027
* Rankings
Ranking Based
On Selection: 37
lithography
machine learning
condensed matter physics
superconductivity
high pressure
Metrics
H-Index
i10 Index
Citation
18
19
949
* Rankings
Ranking Based
On Selection: 38
Metrics
H-Index
i10 Index
Citation
17
23
1,968
* Rankings
Ranking Based
On Selection: 39
Optics
Nanophotonics
Image processing
Metrics
H-Index
i10 Index
Citation
17
21
1,278
* Rankings
Ranking Based
On Selection: 40
Metrics
H-Index
i10 Index
Citation
17
21
700
* Rankings
Ranking Based
On Selection: 41
Lithography
3D integration
semiconductors
process
photovoltaics
Metrics
H-Index
i10 Index
Citation
17
29
2,819
* Rankings
Ranking Based
On Selection: 42
Smart Grids
Demand Response
Active Distribution Networks
Renewable Energy
Semiconductor Processing
Metrics
H-Index
i10 Index
Citation
16
25
1,067
* Rankings
Ranking Based
On Selection: 43
Light Sources for sensors
Metrics
H-Index
i10 Index
Citation
16
24
904
* Rankings
Ranking Based
On Selection: 44
Control systems
Metrics
H-Index
i10 Index
Citation
16
18
1,847
* Rankings
Ranking Based
On Selection: 45
Optics
Magneto-Optics
Ultrafast Magnetism
Ultrafast Spintronics
Metrics
H-Index
i10 Index
Citation
16
16
1,135
* Rankings
Ranking Based
On Selection: 46
Power electronics
Controls
Hardware-In-The-Loop (HIL)
Metrics
H-Index
i10 Index
Citation
16
24
1,153
* Rankings
Ranking Based
On Selection: 47
Semiconductor
Metrics
H-Index
i10 Index
Citation
16
20
1,596
* Rankings
Ranking Based
On Selection: 48
Metrics
H-Index
i10 Index
Citation
16
20
1,128
* Rankings
Ranking Based
On Selection: 49
Semiconductor
MEMS
Magnetic Recording
Nanotechnology
Metrics
H-Index
i10 Index
Citation
16
19
784
* Rankings
Ranking Based
On Selection: 50
Robust nonlinear estimation
robot-GNC
experimental optics
control of flexible structures
Metrics
H-Index
i10 Index
Citation
16
23
1,064
* Rankings
Ranking Based
On Selection: 51
Semiconductor
Electron Microscopy
Materials Science
Metrics
H-Index
i10 Index
Citation
16
27
1,605
* Rankings
Ranking Based
On Selection: 52
Surface physics
EUV
Actinides
Metrics
H-Index
i10 Index
Citation
16
24
953
* Rankings
Ranking Based
On Selection: 53
semiconductor lithography
III-V semiconductors
Metrics
H-Index
i10 Index
Citation
16
21
703
* Rankings
Ranking Based
On Selection: 54
Optical Lithography Modeling
Metrics
H-Index
i10 Index
Citation
16
24
870
* Rankings
Ranking Based
On Selection: 55
condensed matter physics
ultrafast spectroscopy
laser physics
superconductivity
Metrics
H-Index
i10 Index
Citation
15
16
952
* Rankings
Ranking Based
On Selection: 56
Sr. Mechatronic Design Engineer
Metrics
H-Index
i10 Index
Citation
15
17
1,049
* Rankings
Ranking Based
On Selection: 57
Optics
nanophotonics
solid-state lasers
Metrics
H-Index
i10 Index
Citation
15
17
1,731
* Rankings
Ranking Based
On Selection: 58
optical metrology
optics
holography
semiconductor metrology
Metrics
H-Index
i10 Index
Citation
15
20
860
* Rankings
Ranking Based
On Selection: 59
Metrics
H-Index
i10 Index
Citation
15
17
747
* Rankings
Ranking Based
On Selection: 60
Laser Physics
Photonics
Laser Applications
Metrics
H-Index
i10 Index
Citation
15
18
835
* Rankings
Ranking Based
On Selection: 61
compound semicondcutor
Metrics
H-Index
i10 Index
Citation
15
19
1,246
* Rankings
Ranking Based
On Selection: 62
epitaxy
III-V semiconductors
MOCVD
2D materials
Metrics
H-Index
i10 Index
Citation
15
17
673
* Rankings
Ranking Based
On Selection: 63
lithography
patterning
voltage contrast
Metrics
H-Index
i10 Index
Citation
14
14
3,194
* Rankings
Ranking Based
On Selection: 64
Plasma physics
Laser physics
Fluid dynamics
EUV generation
Metrics
H-Index
i10 Index
Citation
14
17
579
* Rankings
Ranking Based
On Selection: 65
Metrics
H-Index
i10 Index
Citation
14
19
1,637
* Rankings
Ranking Based
On Selection: 66
Non-linear Optics
Photonics
Electro-optical Systems
Metrics
H-Index
i10 Index
Citation
14
15
637
* Rankings
Ranking Based
On Selection: 67
nanotechnology
indentation
catalysis
Metrics
H-Index
i10 Index
Citation
14
15
717
* Rankings
Ranking Based
On Selection: 68
Metrics
H-Index
i10 Index
Citation
14
18
940
* Rankings
Ranking Based
On Selection: 69
Material Science
Nano Technology
Metrics
H-Index
i10 Index
Citation
14
16
944
* Rankings
Ranking Based
On Selection: 70
Structural control
vibration control
Mechatronics.
Metrics
H-Index
i10 Index
Citation
13
16
455
* Rankings
Ranking Based
On Selection: 71
Mathematical modeling
Statistical inference
Industrial mathematics
Metrics
H-Index
i10 Index
Citation
13
15
919
* Rankings
Ranking Based
On Selection: 72
Metrics
H-Index
i10 Index
Citation
13
15
678
* Rankings
Ranking Based
On Selection: 73
Wireless communication
Communication signal processing
Electrical System Architecture
Embedded
Metrics
H-Index
i10 Index
Citation
13
14
719
* Rankings
Ranking Based
On Selection: 74
Plasma Physics and Pulsed Power
Metrics
H-Index
i10 Index
Citation
13
16
532
* Rankings
Ranking Based
On Selection: 75
Optical Communications
optical detection
Metrics
H-Index
i10 Index
Citation
13
17
3,094
* Rankings
Ranking Based
On Selection: 76
Physics
Metrics
H-Index
i10 Index
Citation
13
14
1,602
* Rankings
Ranking Based
On Selection: 77
Perovskite physics
Nano electronics
Optoelectronics
Metrics
H-Index
i10 Index
Citation
12
12
1,025
* Rankings
Ranking Based
On Selection: 78
Computational imaging
Label-free microscopy
Optics
Lithography
Metrics
H-Index
i10 Index
Citation
12
14
1,190
* Rankings
Ranking Based
On Selection: 79
Physics
Non-Linear Systems
High Performance Computing
Information Theory
Metrics
H-Index
i10 Index
Citation
12
12
489
* Rankings
Ranking Based
On Selection: 80
photovoltaics
spray
organic
perovskites
renewable energy
Metrics
H-Index
i10 Index
Citation
12
14
1,167
* Rankings
Ranking Based
On Selection: 81
Metrics
H-Index
i10 Index
Citation
12
12
929
* Rankings
Ranking Based
On Selection: 82
automata learning
active learning
model-based testing
Metrics
H-Index
i10 Index
Citation
12
12
896
* Rankings
Ranking Based
On Selection: 83
plasma physics
nuclear fusion
electrostatics
Metrics
H-Index
i10 Index
Citation
12
12
601
* Rankings
Ranking Based
On Selection: 84
Metrics
H-Index
i10 Index
Citation
12
12
596
* Rankings
Ranking Based
On Selection: 85
p
Metrics
H-Index
i10 Index
Citation
12
13
814
* Rankings
Ranking Based
On Selection: 86
Industry (Reliability Physics & Engineering)
Metrics
H-Index
i10 Index
Citation
12
12
1,339
* Rankings
Ranking Based
On Selection: 87
EUV patterning control & metrology
CMP
nanotechnology
Metrics
H-Index
i10 Index
Citation
12
13
1,088
* Rankings
Ranking Based
On Selection: 88
Formal methods
Graph transformation
Data flow models
Metrics
H-Index
i10 Index
Citation
12
12
1,067
* Rankings
Ranking Based
On Selection: 89
hw
sw
Metrics
H-Index
i10 Index
Citation
12
13
370
* Rankings
Ranking Based
On Selection: 90
Computational Materials Science
Metrics
H-Index
i10 Index
Citation
11
13
1,874
* Rankings
Ranking Based
On Selection: 91
Solid mechanics
Composite materials
Micromechanics
Responsive polymers
Computational mechanics
Metrics
H-Index
i10 Index
Citation
11
11
479
* Rankings
Ranking Based
On Selection: 92
thin films and membranes
structure and functional properties
Metrics
H-Index
i10 Index
Citation
11
11
347
* Rankings
Ranking Based
On Selection: 93
Quantum Optics
Semiconductor Devices
Metrics
H-Index
i10 Index
Citation
11
12
955
* Rankings
Ranking Based
On Selection: 94
semiconductors
ceramics
phosphors
materials
solar
Metrics
H-Index
i10 Index
Citation
11
12
610
* Rankings
Ranking Based
On Selection: 95
Data Science
Medical Statistics
Markov Chains
Stochastic Modeling
Metrics
H-Index
i10 Index
Citation
11
12
317
* Rankings
Ranking Based
On Selection: 96
Scatterometry
Machine Learning
Artificial Intelligence
Data Science
Medical Image Analysis
Metrics
H-Index
i10 Index
Citation
11
12
556
* Rankings
Ranking Based
On Selection: 97
Radar Waveform Design
Radar Communication
Systems Engineering
Antenna Measurements
Radar Resource Management
Metrics
H-Index
i10 Index
Citation
11
12
481
* Rankings
Ranking Based
On Selection: 98
Algorithm Design
Distributed Sensors
Multi-agent Systems
Robust Nonlinear Control
System Identification
Metrics
H-Index
i10 Index
Citation
11
12
363
* Rankings
Ranking Based
On Selection: 99
Metrics
H-Index
i10 Index
Citation
11
12
299
* Rankings
Ranking Based
On Selection: 100
optical metrology
simulations
electronics
Metrics
H-Index
i10 Index
Citation
11
11
328
Liang Wang
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
41
101
5,964
Harmke De Groot
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
39
62
4,298
IoT
connectivity
sensors
sensor fusion
innovation management
Timothy A. Brunner
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
39
113
5,804
Vadim Banine
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
38
155
6,255
Qinghuang Lin
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
37
88
4,065
materials science
patterning
devices
systems
life sciences
Stefan Hunsche
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
32
69
6,180
Wolter Siemons
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
31
44
5,390
Robert Socha
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
30
84
3,113
Se-Heon Kim
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
30
46
4,784
photonics
nanotechnology
optics
Christopher Spence
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
30
61
3,243
Lithography
Metrology
Photomasks
Amorphous Materials
Polymer Chemistry/Dynamics
Yuanqing Yang
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
29
40
3,138
Viktor Chikan
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
29
54
3,052
physical chemistry
nanotechnology
laser spectroscopy
cancer research and drug delivery
EUV
Farzad Fareed|Farzad Behafarid
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
29
31
4,422
Thin films
optical modeling
interference coatings
Nano science and technology
Nano catalysis
Steven G. Hansen
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
29
69
3,437
Mark Van De Kerkhof|M van de Kerkhof, Marcus van de Kerkhof, Marcus Adrianus van de Kerkhof
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
25
50
2,678
Amir Abdolvand
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
25
33
2,643
Quantum Coherent Control
Ultrafast Nonlinear Optics
Photonic Crystal Fibres
Coherent Raman Interaction
Spectroscopy
Stephen D. Hsu
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
25
62
2,071
DUV EUV lithography
computational lithography
source mask optimization
multiple patterning
resolution enhancement technique
Ilias Katsouras
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
24
31
2,502
Awm (Jos) Van Schijndel
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
24
49
2,658
Carlo Luijten
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
24
38
2,116
Inci Donmez Noyan
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
21
29
2,053
Alex Schafgans
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
21
31
1,852
Michael Engel
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
21
28
4,363
Philipp Strack
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
21
24
1,627
Quantum Optics
Condensed Matter Physics
Quantum Field Theory
Alexander Ypma
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
21
31
1,930
Machine learning
Pattern recognition
Data mining
Lithography
Robert J. Rafac
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
21
38
2,040
atomic spectroscopy
optical frequency standards
lithography
plasma physics
Michael Lercel
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
21
35
2,024
Rahim Rezaeiha
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
20
24
2,888
Fluid Mechanics
CFD
Renewable Energy
Flow Control
Seong Chan Kim
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
20
25
1,680
Kiranmayee Kilaru
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
19
35
1,410
X-ray optics
optical design
optical metrology
differential deposition
Ws Christian Roelofs
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
19
26
2,576
Dries Van Gestel
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
19
29
1,430
Koen Schreel
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
19
22
1,093
Biran Wang
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
18
20
1,435
Nanotechnology
Materials Science
Contamination Control
Additive Manufacturing
Martin Jurna
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
18
24
1,027
Shibing Wang
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
18
19
949
lithography
machine learning
condensed matter physics
superconductivity
high pressure
Tristan Mes
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
17
23
1,968
Filippo Alpeggiani
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
17
21
1,278
Juliane Reinhardt
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
17
21
700
Steven E. Steen
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
17
29
2,819
Lithography
3D integration
semiconductors
process
photovoltaics
Niyam Haque
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
16
25
1,067
Smart Grids
Demand Response
Active Distribution Networks
Renewable Energy
Semiconductor Processing
Zeudi Mazzotta
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
16
24
904
Victor Dolk
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
16
18
1,847
Thomas Huisman
ASML Holding
Veldhoven, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
16
16
1,135
Optics
Magneto-Optics
Ultrafast Magnetism
Ultrafast Spintronics
Hesan Vahedi
ASML Holding
Veldhoven, Netherlands
Metrics
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16
24
1,153
Power electronics
Controls
Hardware-In-The-Loop (HIL)
Michiel Coenen
ASML Holding
Veldhoven, Netherlands
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16
20
1,128
Johan Bc Engelen|Johannes Bernardus Charles Engelen
ASML Holding
Veldhoven, Netherlands
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16
19
784
Semiconductor
MEMS
Magnetic Recording
Nanotechnology
Abhijit Kallapur
ASML Holding
Veldhoven, Netherlands
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i10 Index
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16
23
1,064
Robust nonlinear estimation
robot-GNC
experimental optics
control of flexible structures
Roger Alvis
ASML Holding
Veldhoven, Netherlands
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i10 Index
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16
27
1,605
Semiconductor
Electron Microscopy
Materials Science
Martin Butterfield
ASML Holding
Veldhoven, Netherlands
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16
24
953
Lukasz Macht
ASML Holding
Veldhoven, Netherlands
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16
21
703
condensed matter physics
ultrafast spectroscopy
laser physics
superconductivity
Mohsen Zafarani
ASML Holding
Veldhoven, Netherlands
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15
17
1,049
Sr. Mechatronic Design Engineer
Onur Kuzucu
ASML Holding
Veldhoven, Netherlands
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15
17
1,731
Nitesh Pandey
ASML Holding
Veldhoven, Netherlands
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15
20
860
optical metrology
optics
holography
semiconductor metrology
Ilaria Cardinaletti
ASML Holding
Veldhoven, Netherlands
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15
17
747
Slava Rokitski
ASML Holding
Veldhoven, Netherlands
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i10 Index
Citation Counts
15
18
835
Laser Physics
Photonics
Laser Applications
Yuejun Sun
ASML Holding
Veldhoven, Netherlands
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15
19
1,246
Tommaso Orzali
ASML Holding
Veldhoven, Netherlands
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15
17
673
epitaxy
III-V semiconductors
MOCVD
2D materials
Achim Woessner
ASML Holding
Veldhoven, Netherlands
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14
14
3,194
Dmitry Kurilovich
ASML Holding
Veldhoven, Netherlands
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14
17
579
Plasma physics
Laser physics
Fluid dynamics
EUV generation
Timur Tudorovskiy
ASML Holding
Veldhoven, Netherlands
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14
19
1,637
Non-linear Optics
Photonics
Electro-optical Systems
Violeta Navarro
ASML Holding
Veldhoven, Netherlands
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14
15
717
nanotechnology
indentation
catalysis
Nirupam Banerjee
ASML Holding
Veldhoven, Netherlands
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14
16
944
Material Science
Nano Technology
Bilal Mokrani
ASML Holding
Veldhoven, Netherlands
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13
16
455
Structural control
vibration control
Mechatronics.
Antonios Zagaris
ASML Holding
Veldhoven, Netherlands
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13
15
919
Mathematical modeling
Statistical inference
Industrial mathematics
Gonzalo Sanguinetti
ASML Holding
Veldhoven, Netherlands
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13
15
678
Wireless communication
Communication signal processing
Electrical System Architecture
Embedded
Russell Burdt
ASML Holding
Veldhoven, Netherlands
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13
16
532
Jingshi Li
ASML Holding
Veldhoven, Netherlands
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13
17
3,094
Arie Den Boef
ASML Holding
Veldhoven, Netherlands
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i10 Index
Citation Counts
13
14
1,602
Ting-You Li
ASML Holding
Veldhoven, Netherlands
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i10 Index
Citation Counts
12
12
1,025
Perovskite physics
Nano electronics
Optoelectronics
Li-Hao Yeh
ASML Holding
Veldhoven, Netherlands
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Citation Counts
12
14
1,190
A Vamsi Spandan
ASML Holding
Veldhoven, Netherlands
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12
12
489
Physics
Non-Linear Systems
High Performance Computing
Information Theory
Jeffrey Gerhart Tait
ASML Holding
Veldhoven, Netherlands
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Citation Counts
12
14
1,167
photovoltaics
spray
organic
perovskites
renewable energy
Boris Le Feber
ASML Holding
Veldhoven, Netherlands
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12
12
929
plasma physics
nuclear fusion
electrostatics
Omar Aljanaideh
ASML Holding
Veldhoven, Netherlands
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12
12
596
Hamid Reza Amir-Ahmadi
ASML Holding
Veldhoven, Netherlands
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12
13
814
Talal Kamel
ASML Holding
Veldhoven, Netherlands
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12
12
1,339
Industry (Reliability Physics & Engineering)
EUV patterning control & metrology
CMP
nanotechnology
Amirhossein Ghamarian
ASML Holding
Veldhoven, Netherlands
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i10 Index
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12
12
1,067
Formal methods
Graph transformation
Data flow models
Aleksandar Beric
ASML Holding
Veldhoven, Netherlands
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12
13
370
Chaitanya Krishna Ande
ASML Holding
Veldhoven, Netherlands
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11
13
1,874
Computational Materials Science
Ling Liu (刘凌)
ASML Holding
Veldhoven, Netherlands
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11
11
479
Solid mechanics
Composite materials
Micromechanics
Responsive polymers
Computational mechanics
Paul A. Vermeulen
ASML Holding
Veldhoven, Netherlands
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11
11
347
Kutlu Kutluer
ASML Holding
Veldhoven, Netherlands
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11
12
955
Clayton Cozzan
ASML Holding
Veldhoven, Netherlands
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11
12
610
semiconductors
ceramics
phosphors
materials
solar
Carlo Lancia
ASML Holding
Veldhoven, Netherlands
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11
12
317
Data Science
Medical Statistics
Markov Chains
Stochastic Modeling
Sm Masudur Rahman Al Arif
ASML Holding
Veldhoven, Netherlands
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11
12
556
Scatterometry
Machine Learning
Artificial Intelligence
Data Science
Medical Image Analysis
Recep Firat Tigrek
ASML Holding
Veldhoven, Netherlands
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11
12
481
Radar Waveform Design
Radar Communication
Systems Engineering
Antenna Measurements
Radar Resource Management
Farshid Abbasi
ASML Holding
Veldhoven, Netherlands
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11
12
363
Algorithm Design
Distributed Sensors
Multi-agent Systems
Robust Nonlinear Control
System Identification
Mireille Smets
ASML Holding
Veldhoven, Netherlands
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Citation Counts
11
12
299