Citation Rankings
Highly Cited Researchers
Highly Cited Researchers 308 Scientists Citation Rankings - 2025
Discover the world’s highly cited researchers through the AD Scientific Index 2025 Citation Rankings.
These rankings evaluate scientists based on their total and recent citation counts, capturing the breadth and real-time currency of academic recognition. Citation data reveals how widely a scholar’s work is referenced, applied, and extended across diverse disciplines. The rankings are routinely updated to reflect ongoing citation growth, while eliminating distortions from excessive co-authorship and institutional inflation. Premium tools provide access to detailed citation dynamics, unethical citation behavior detection, and field-normalized benchmarking.
* Total Citation Counts Rankings
Ranking Based On Selection: 26
Optische lithografie
warmte en stromin
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,142
619
0.289
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* Total Citation Counts Rankings
Ranking Based On Selection: 27
Solar Fuels
Semiconductors
Nanotechnology
(Photo)Electrochemistry
Catalysi
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,129
1,464
0.688
* Total Citation Counts Rankings
Ranking Based On Selection: 28
Thin films
MEM
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,106
1,055
0.501
* Total Citation Counts Rankings
Ranking Based On Selection: 29
DUV EUV lithography
computational lithography
source mask optimization
multiple patterning
resolution enhancement techniqu
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,097
483
0.230
* Total Citation Counts Rankings
Ranking Based On Selection: 30
atomic spectroscopy
optical frequency standards
lithography
plasma physic
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,082
402
0.193
* Total Citation Counts Rankings
Ranking Based On Selection: 31
Semiconductor lithography
metrology
and inspectio
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,035
170
0.084
* Total Citation Counts Rankings
Ranking Based On Selection: 32
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,009
895
0.445
* Total Citation Counts Rankings
Ranking Based On Selection: 33
Machine learning
Pattern recognition
Data mining
Lithograph
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,954
481
0.246
* Total Citation Counts Rankings
Ranking Based On Selection: 34
Computational Materials Scienc
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,929
1,155
0.599
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* Total Citation Counts Rankings
Ranking Based On Selection: 35
Control system
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,914
1,390
0.726
* Total Citation Counts Rankings
Ranking Based On Selection: 36
EUV Lithography
laser produced plasm
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,904
688
0.361
* Total Citation Counts Rankings
Ranking Based On Selection: 37
Optics
nanophotonics
solid-state laser
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,757
362
0.206
* Total Citation Counts Rankings
Ranking Based On Selection: 38
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,709
712
0.417
* Total Citation Counts Rankings
Ranking Based On Selection: 39
Semiconducto
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,687
301
0.178
* Total Citation Counts Rankings
Ranking Based On Selection: 40
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,669
455
0.273
* Total Citation Counts Rankings
Ranking Based On Selection: 41
Quantum Optics
Condensed Matter Physics
Quantum Field Theor
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,650
590
0.358
* Total Citation Counts Rankings
Ranking Based On Selection: 42
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,644
343
0.209
* Total Citation Counts Rankings
Ranking Based On Selection: 43
Semiconductor
Electron Microscopy
Materials Scienc
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,617
273
0.169
* Total Citation Counts Rankings
Ranking Based On Selection: 44
Physic
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,599
150
0.094
* Total Citation Counts Rankings
Ranking Based On Selection: 45
Nanotechnology
Materials Science
Contamination Control
Additive Manufacturin
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,538
1,228
0.798
* Total Citation Counts Rankings
Ranking Based On Selection: 46
Microscopy
Nanocrystals
THz spectroscopy
pump-probe spectroscop
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,522
580
0.381
* Total Citation Counts Rankings
Ranking Based On Selection: 47
Particle Flow
Vacuum
Lattice Boltzmann
Surface Science
Tribolog
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,500
369
0.246
* Total Citation Counts Rankings
Ranking Based On Selection: 48
X-ray optics
optical design
optical metrology
differential depositio
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,467
998
0.680
* Total Citation Counts Rankings
Ranking Based On Selection: 49
Optical Engineerin
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,465
601
0.410
* Total Citation Counts Rankings
Ranking Based On Selection: 50
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,435
139
0.097
* Total Citation Counts Rankings
Rankings
440,869
8,738
26
Ranking Based On Selection: 26
Carlo Luijten
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,142
619
0.289
* Total Citation Counts Rankings
Rankings
442,677
8,762
27
Ranking Based On Selection: 27
Bartek J. Trześniewski
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,129
1,464
0.688
Solar Fuels
Semiconductors
Nanotechnology
(Photo)Electrochemistry
Catalysi
* Total Citation Counts Rankings
Rankings
446,178
8,815
28
Ranking Based On Selection: 28
Inci Donmez Noyan
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,106
1,055
0.501
* Total Citation Counts Rankings
Rankings
447,634
8,845
29
Ranking Based On Selection: 29
Stephen D. Hsu
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,097
483
0.230
DUV EUV lithography
computational lithography
source mask optimization
multiple patterning
resolution enhancement techniqu
* Total Citation Counts Rankings
Rankings
449,913
8,875
30
Ranking Based On Selection: 30
Robert J. Rafac
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,082
402
0.193
atomic spectroscopy
optical frequency standards
lithography
plasma physic
* Total Citation Counts Rankings
Rankings
457,231
8,993
31
Ranking Based On Selection: 31
Michael Lercel
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,035
170
0.084
* Total Citation Counts Rankings
Rankings
461,410
9,053
32
Ranking Based On Selection: 32
Tristan Mes
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,009
895
0.445
* Total Citation Counts Rankings
Rankings
470,567
9,194
33
Ranking Based On Selection: 33
Alexander Ypma
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,954
481
0.246
Machine learning
Pattern recognition
Data mining
Lithograph
* Total Citation Counts Rankings
Rankings
474,714
9,259
34
Ranking Based On Selection: 34
Chaitanya Krishna Ande
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,929
1,155
0.599
Computational Materials Scienc
* Total Citation Counts Rankings
Rankings
477,214
9,301
35
Ranking Based On Selection: 35
Victor Dolk
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,914
1,390
0.726
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* Total Citation Counts Rankings
Rankings
479,073
9,333
36
Ranking Based On Selection: 36
Alex Schafgans
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,904
688
0.361
* Total Citation Counts Rankings
Rankings
506,189
9,725
37
Ranking Based On Selection: 37
Onur Kuzucu
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,757
362
0.206
* Total Citation Counts Rankings
Rankings
515,492
9,849
38
Ranking Based On Selection: 38
Seong Chan Kim
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,709
712
0.417
* Total Citation Counts Rankings
Rankings
519,948
9,933
39
Ranking Based On Selection: 39
Qian Zhao
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,687
301
0.178
* Total Citation Counts Rankings
Rankings
523,542
9,980
40
Ranking Based On Selection: 40
Timur Tudorovskiy
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,669
455
0.273
* Total Citation Counts Rankings
Rankings
527,364
10,041
41
Ranking Based On Selection: 41
Philipp Strack
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,650
590
0.358
Quantum Optics
Condensed Matter Physics
Quantum Field Theor
* Total Citation Counts Rankings
Rankings
528,586
10,062
42
Ranking Based On Selection: 42
Jeroen Cottaar
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,644
343
0.209
* Total Citation Counts Rankings
Rankings
534,156
10,142
43
Ranking Based On Selection: 43
Roger Alvis
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,617
273
0.169
Semiconductor
Electron Microscopy
Materials Scienc
* Total Citation Counts Rankings
Rankings
537,910
10,199
44
Ranking Based On Selection: 44
Arie Den Boef
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,599
150
0.094
* Total Citation Counts Rankings
Rankings
551,205
10,398
45
Ranking Based On Selection: 45
Biran Wang
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,538
1,228
0.798
Nanotechnology
Materials Science
Contamination Control
Additive Manufacturin
* Total Citation Counts Rankings
Rankings
555,005
10,445
46
Ranking Based On Selection: 46
Lucas Kunneman
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,522
580
0.381
Microscopy
Nanocrystals
THz spectroscopy
pump-probe spectroscop
* Total Citation Counts Rankings
Rankings
560,159
10,522
47
Ranking Based On Selection: 47
Sandra Van Der Graaf
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,500
369
0.246
Particle Flow
Vacuum
Lattice Boltzmann
Surface Science
Tribolog
* Total Citation Counts Rankings
Rankings
567,642
10,625
48
Ranking Based On Selection: 48
Kiranmayee Kilaru
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,467
998
0.680
X-ray optics
optical design
optical metrology
differential depositio
* Total Citation Counts Rankings
Rankings
568,236
10,639
49
Ranking Based On Selection: 49
Ye Tian
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,465
601
0.410
* Total Citation Counts Rankings
Rankings
575,527
10,743
50
Ranking Based On Selection: 50
Dries Van Gestel
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,435
139
0.097