Lam Research Corp. is a
prestigious company university
established in 1980 in United States. It is represented
by 114 scientists in the AD Scientific Index. The
university’s scientists are particularly concentrated in
Natural Sciences (21 scientists), Engineering & Technology (17 scientists), and Business & Management (2 scientists).
* Total H Index Rankings
Ranking Based
On Selection: 1
Chemistry
Materials Science
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
51
30
0.588
* Total H Index Rankings
Ranking Based
On Selection: 2
Semiconductor Manufacturing
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
43
26
0.605
* Total H Index Rankings
Ranking Based
On Selection: 3
Semiconductor
Nanomaterials
Graphene
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
38
32
0.842
* Total H Index Rankings
Ranking Based
On Selection: 4
thin film deposition
surface science
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
34
21
0.618
* Total H Index Rankings
Ranking Based
On Selection: 5
Core-Level Spectroscopy
Electrochemistry
Catalysis
EUV Lithography
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
28
23
0.821
* Total H Index Rankings
Ranking Based
On Selection: 6
Atomic Layer Etching
Selective Etch
Semiconductor processes
Plasma Physics
Plasma Confinement
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
26
17
0.654
* Total H Index Rankings
Ranking Based
On Selection: 7
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
25
21
0.840
* Total H Index Rankings
Ranking Based
On Selection: 8
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
25
17
0.680
* Total H Index Rankings
Ranking Based
On Selection: 9
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
25
16
0.640
* Total H Index Rankings
Ranking Based
On Selection: 10
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
22
15
0.682
* Total H Index Rankings
Ranking Based
On Selection: 11
light emitting diodes
Chemical Mechanical Polishing
Thin Films
Hydrogen Diffusion
Single Crystals
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
16
0.762
* Total H Index Rankings
Ranking Based
On Selection: 12
Plasma
Modeling
CVD
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
20
15
0.750
* Total H Index Rankings
Ranking Based
On Selection: 13
Heterogeneous Catalysis - Surface Science - Materials Science - Nanomaterials.
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
20
13
0.650
* Total H Index Rankings
Ranking Based
On Selection: 14
Atomic Layer Deposition
Chemical Vapor Deposition
XAS
X-ray Photoelectron Spectroscopy
Spectroscopic Ellipsometry
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
19
16
0.842
* Total H Index Rankings
Ranking Based
On Selection: 15
Emerging Memory
Surface Science
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
19
13
0.684
* Total H Index Rankings
Ranking Based
On Selection: 16
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
19
12
0.632
* Total H Index Rankings
Ranking Based
On Selection: 17
Surface Science
Silicides
electrochemical plating
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
19
8
0.421
* Total H Index Rankings
Ranking Based
On Selection: 18
Electron Microscopy
Semiconductors
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
18
11
0.611
* Total H Index Rankings
Ranking Based
On Selection: 19
EUV Materials & process technologist
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
18
10
0.556
* Total H Index Rankings
Ranking Based
On Selection: 20
Atomic Layer Deposition
Dry Plasma Etch
System Engineer
Process Engineer
Product Engineer
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
12
0.706
* Total H Index Rankings
Ranking Based
On Selection: 21
Surface Chemistry
Semiconductors
Catalysis
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
10
0.588
* Total H Index Rankings
Ranking Based
On Selection: 22
MEMS
Semiconductors
microfabrication
RIE
dry etch
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
4
0.235
* Total H Index Rankings
Ranking Based
On Selection: 23
nanoscience
nanophysics
and nanotechnology
Plasma physics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
15
0.938
* Total H Index Rankings
Ranking Based
On Selection: 24
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
14
0.875
* Total H Index Rankings
Ranking Based
On Selection: 25
PECVD
ALD
MEMS
Semiconductor manufacturing
Electrostatic Chucks
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
13
0.813
Timothy Weidman
Lam Research Corp.
Fremont, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
51
30
0.588
Thorsten Lill
Lam Research Corp.
Fremont, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
43
26
0.605
Li Yilun
Lam Research Corp.
Fremont, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
38
32
0.842
Semiconductor
Nanomaterials
Graphene
Nerissa Draeger|Nerissa Taylor
Lam Research Corp.
Fremont, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
34
21
0.618
Cheng Hao Wu
Lam Research Corp.
Fremont, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
28
23
0.821
Core-Level Spectroscopy
Electrochemistry
Catalysis
EUV Lithography
Andreas Fischer
Lam Research Corp.
Fremont, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
26
17
0.654
Atomic Layer Etching
Selective Etch
Semiconductor processes
Plasma Physics
Plasma Confinement
John Valcore Jr
Lam Research Corp.
Fremont, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
25
21
0.840
Martijn Lenes
Lam Research Corp.
Fremont, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
25
17
0.680
Theo Panagopoulos
Lam Research Corp.
Fremont, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
25
16
0.640
Yixuan Yu
Lam Research Corp.
Fremont, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
22
15
0.682
Purushottam Kumar
Lam Research Corp.
Fremont, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
16
0.762
light emitting diodes
Chemical Mechanical Polishing
Thin Films
Hydrogen Diffusion
Single Crystals
Yukinori Sakiyama
Lam Research Corp.
Fremont, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
20
15
0.750
Gérôme Melaet
Lam Research Corp.
Fremont, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
20
13
0.650
Heterogeneous Catalysis - Surface Science - Materials Science - Nanomaterials.
David J Mandia
Lam Research Corp.
Fremont, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
19
16
0.842
Atomic Layer Deposition
Chemical Vapor Deposition
XAS
X-ray Photoelectron Spectroscopy
Spectroscopic Ellipsometry
Zhongwei Zhu
Lam Research Corp.
Fremont, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
19
13
0.684
Arnepalli Ranga Rao
Lam Research Corp.
Fremont, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
19
12
0.632
Zhian He
Lam Research Corp.
Fremont, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
19
8
0.421
Zahra Vashaei
Lam Research Corp.
Fremont, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
18
11
0.611
Anuja De Silva
Lam Research Corp.
Fremont, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
18
10
0.556
EUV Materials & process technologist
Zohreh Razavi Hesabi
Lam Research Corp.
Fremont, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
12
0.706
Atomic Layer Deposition
Dry Plasma Etch
System Engineer
Process Engineer
Product Engineer
Nathan Musselwhite
Lam Research Corp.
Fremont, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
10
0.588
Surface Chemistry
Semiconductors
Catalysis
Sangjun Park
Lam Research Corp.
Fremont, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
4
0.235
Hwan Sung Choe
Lam Research Corp.
Fremont, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
15
0.938
nanoscience
nanophysics
and nanotechnology
Plasma physics
Yanhui Huang
Lam Research Corp.
Fremont, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
14
0.875
Sergey Belostotskiy
Lam Research Corp.
Fremont, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
13
0.813
PECVD
ALD
MEMS
Semiconductor manufacturing
Electrostatic Chucks