i10 Productivity
Rankings
ASML Holding/ Scientists i10 Productivity Rankings 2025
Productivity Rankings is an exclusive service provided by AD Scientific Index. This ranking system, derived from the i10 index, highlights the productivity of scientists in publishing impactful scientific articles. Productivity Rankings serves as a tool to identify highly productive scientists across specific areas, disciplines, universities, and countries, and supports the creation of effective incentives and academic policies. The global, regional, and institutional rankings of scientists in this table are calculated based on their total i10 index. Moreover, you can explore special rankings derived from Productivity Rankings, such as Scientists Last 6 Years' i10 Index, Universities Total i10 Index Rankings 2025, Universities Last 6 Years' i10 Index Rankings 2025, Art and Humanities i10 Productivity Rankings, and Social Sciences and Humanities i10 Productivity Rankings.
* Total i10 IndexRankings
Ranking Based On Selection :101
Algorithm Design
Distributed Sensors
Multi-agent Systems
Robust Nonlinear Control
System Identification
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
8
0.727
* Total i10 IndexRankings
Ranking Based On Selection :102
lithography
overlay
imaging
machine learning
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
7
0.636
* Total i10 IndexRankings
Ranking Based On Selection :103
Optical Thin Films
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
6
0.545
* Total i10 IndexRankings
Ranking Based On Selection :104
EUV
Laser
Plasma
liquid metal
fluid flow
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
6
0.545
* Total i10 IndexRankings
Ranking Based On Selection :105
CFD
Rarefied gas flows
Adaptive Refinement
Moving boundary
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
6
0.545
* Total i10 IndexRankings
Ranking Based On Selection :106
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
5
0.455
* Total i10 IndexRankings
Ranking Based On Selection :107
Robust control
Signal processing
Fault diagnosis
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
5
0.455
* Total i10 IndexRankings
Ranking Based On Selection :108
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
4
0.364
* Total i10 IndexRankings
Ranking Based On Selection :109
Laser Physics
Ultrafast Optics
Multiphoton Microscopy
Coherent Raman Imaging
Femtosecond Micromachining
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
4
0.364
* Total i10 IndexRankings
Ranking Based On Selection :110
Mechatronics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
3
0.273
* Total i10 IndexRankings
Ranking Based On Selection :111
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
1
0.091
* Total i10 IndexRankings
Ranking Based On Selection :112
Optics
Laser Physics
Atomic Physics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
1
0.091
* Total i10 IndexRankings
Ranking Based On Selection :113
thin films and membranes
structure and functional properties
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
10
1.000
* Total i10 IndexRankings
Ranking Based On Selection :114
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
8
0.800
* Total i10 IndexRankings
Ranking Based On Selection :115
Signal Processing
Metrology
Machine Learning
System Design
Semiconductors
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
8
0.800
* Total i10 IndexRankings
Ranking Based On Selection :116
Terahertz
photonics
near-field optics
metasurfaces
plasmonics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
8
0.800
* Total i10 IndexRankings
Ranking Based On Selection :117
Particle flow
Vacuum
Lattice Boltzmann
Emulsification
Surface Science
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
7
0.700
* Total i10 IndexRankings
Ranking Based On Selection :118
physics
optomechanics
nanophotonics
NEMS
nanoelectronics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
7
0.700
* Total i10 IndexRankings
Ranking Based On Selection :119
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
6
0.600
* Total i10 IndexRankings
Ranking Based On Selection :120
Control
Modeling
Simulation
System Identification
Validation
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
6
0.600
* Total i10 IndexRankings
Ranking Based On Selection :121
optical metrology
simulations
electronics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
6
0.600
* Total i10 IndexRankings
Ranking Based On Selection :122
Thin films
Optical coatings
Plasma Etch
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
5
0.500
* Total i10 IndexRankings
Ranking Based On Selection :123
Semiconductors
machine overlay
Optics
Medical ultrasound
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
5
0.500
* Total i10 IndexRankings
Ranking Based On Selection :124
channel coding
signal processing
image processing
machine learning
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
1
0.100
* Total i10 IndexRankings
Ranking Based On Selection :125
Electrochemistry
Physicochemistry
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
9
9
1.000
Farshid Abbasi
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
8
0.727
Algorithm Design
Distributed Sensors
Multi-agent Systems
Robust Nonlinear Control
System Identification
Emil Schmitt-Weaver
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
7
0.636
lithography
overlay
imaging
machine learning
Stephen Swiontek
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
6
0.545
Chuangxin Zhao
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
6
0.545
Eray Uzgoren
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
6
0.545
Guido Salmaso
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
5
0.455
Amol A. Khalate
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
5
0.455
Jeroen Cottaar
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
4
0.364
Aram Zeytunyan
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
4
0.364
Laser Physics
Ultrafast Optics
Multiphoton Microscopy
Coherent Raman Imaging
Femtosecond Micromachining
Kalyan Kumar Mankala
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
3
0.273
Arjan Van Der Sijs
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
1
0.091
Andrey Tychkov
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
1
0.091
Paul A. Vermeulen
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
10
1.000
Anton Baranikov
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
8
0.800
Anagnostis Tsiatmas
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
8
0.800
Signal Processing
Metrology
Machine Learning
System Design
Semiconductors
Arkabrata Bhattacharya
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
8
0.800
Terahertz
photonics
near-field optics
metasurfaces
plasmonics
Sandra Van Der Graaf
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
7
0.700
Particle flow
Vacuum
Lattice Boltzmann
Emulsification
Surface Science
John P Mathew
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
7
0.700
physics
optomechanics
nanophotonics
NEMS
nanoelectronics
Ronald Otten
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
6
0.600
Andrei Dorobantu
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
6
0.600
Sarathi Roy
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
6
0.600
Ping Kuang
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
5
0.500
Thin films
Optical coatings
Plasma Etch
Shreyas Raghunathan
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
5
0.500
Yiming Chen
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
1
0.100
channel coding
signal processing
image processing
machine learning
Isis Ledezma-Yanez
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
9
9
1.000